نتایج جستجو برای: keywords yield gap
تعداد نتایج: 2239183 فیلتر نتایج به سال:
The documentation process is very important for identifying yield constraint factors and yield gap. For this purpose, all managing practices were recorded by monitoring of paddy rice fields in Sari region, Iran from 2015 to 2016. Field identifications were undertaken in such a way that they included all the main production procedures with variations in management viewpoints. The results reveale...
Automatic test data generation (ATG) is a major topic in software engineering. In this paper, we seek to bridge the gap between the coverage criteria supported by symbolic ATG tools and the most advanced coverage criteria found in the literature. We define a new testing criterion, label coverage, and prove it to be both expressive and amenable to efficient automation. We propose several innovat...
Automatic test data generation (ATG) is a major topic in software engineering. In this paper, we bridge the gap between the coverage criteria supported by state-of-the-art whitebox ATG technologies, especially Dynamic Symbolic Execution, and advanced coverage criteria found in the literature. We define a new testing criterion, label coverage, and prove it to be both expressive and amenable to e...
Despite the routine collection of annual agricultural surveys and significant advances in GIS and remote sensing products, little econometric research has integrated these data sources in estimating developing nations' agricultural yields. In this paper, we explore the determinants of wheat output per hectare in Ethiopia during the 2011-2013 principal Meher crop seasons at the kebele administra...
this paper, i have focused on the tax side of the fiscal policy to investigate the past and future behavior of fiscal sustainability in iran. to do so, i have employed two different forward-looking and backward-looking approaches. first, the backward-looking approach is the fiscal policy rule proposed by daving & leeper (2011). precisely, this rule determines that whether the fiscal policy is ...
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با پیشرفت تکنولوژی و کاهش ابعاد ترانزیستور، تلرانس پارامترهای ساخت مدارات الکترونیک افزایش یافته و باعث کاهش ضریب yield می شود. در طراحی مدارات الکترونیک، طراح عموما مقادیر نامی را برای دست یابی به عملکرد مطلوب استخراج می کند، در حالی که، در عمل یک ناحیه تلرانس، به دلیل فرآیند های تصادفی حین فرآیند های ساخت، وجود دارد که بایستی در طراحی لحاظ گردد. الگوریتم های بهینه سازی طراحی تلرانس، ناحیه تلر...
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