and its impact on GaN grown by metal organic vapor phase epitaxy on sapphire: An x-ray diffraction study J. Bläsing, A. Krost, J. Hertkorn, F. Scholz, L. Kirste, A. Chuvilin, and U. Kaiser Institute of Experimental Physics, Otto-von-Guericke-University Magdeburg, Universitätsplatz 2, D-39016 Magdeburg, Germany Institute of Optoelectronics, Ulm University, Albert-Einstein-Allee 45, D-89081 Ulm, ...

The application of the speckle phenomenon to the analysis of in-plane translations and oscillations is first reviewed briefly. Then a practical method of investigating out-of-plane rotations (tilts) even in the presence of in-plane movements is studied. This goal can be achieved by recording the speckle patterns in the Fourier transform plane before and after the tilt or as a time-average expos...

In this paper we study a realistic setup for phase retrieval, where the signal of interest is modulated or masked and then for each modulation or mask a diffraction pattern is collected, producing a coded diffraction pattern (CDP) [CLM13]. We are interested in the setup where the resolution of the collected CDP is limited by the Fraunhofer diffraction limit of the imaging system. We investigate...

Stefan-Peter Weber, Leistungselektronik und EMV, Fraunhofer IZM, Berlin André Linde, Student der Elektrotechnik, TU Berlin Dr. Eckart Hoene, Leistungselektronik und EMV, Fraunhofer IZM, Berlin Dr. Stephan Guttowski, Advanced System Development, Fraunhofer IZM, Berlin Werner John, Advanced System Engineering, Fraunhofer IZM, Paderborn Prof. Dr.-Ing. Dr. E.h. Herbert Reichl, FSP Technologien der ...