An ultra-high vacuum time-of-flight (TOF) atom-probe field-ion microscope (FIM) specifically designed for the study of defects in metals is described. Performance experiments show that this instrument can clearly resolve the seven stable isotopes of molybdenum, the five stable isotopes of tungsten, and the two stable isotopes of rhenium in a tungsten-25at.% rhenium alloy. The entire process of ...

Sébastien Aubert*, Elise Ghibaudo, Aurélien Bruyant*, Sylvain Blaize*, Renaud Bachelot*, Gilles Lerondel*, Pascal Royer*, Jean-Emmanuel Broquin [email protected] Laboratoire de Nanotechnologie et d’Instrumentation Optique, Université de Technologie de Troyes, 12 rue Marie Curie, BP2060, 10010 Troyes cedex, France Institut de Microélectronique, Electromagnétisme et Photonique, LEMO-ENSERG, UMR 5530,...

Experiments are described during which both the Ir(llO)lx2 and the Ir(1OO)lxS reconstructed surfaces could be imaged in the FIM. Furthermore evidence for a possible 1x2 reconstruction of the Ir(113) surface was found. Introduction It is well khown that on many semiconductor and some metal surfaces the topmost layer of atoms can rearrange to form structures different from those of the underlying...

Figure 2. Angular distributions of inelastic scattering around the undiffracted beam and around a beam diffracted through an angle a. The shaded area represents the contribution from the diffracted beam to the intensity collected by an on-axis aperture of semi-angle A3. [6] Egerton, R. F., Electron Energy Loss Spectroscopy in the Electron Microscope, Plenum Press, New York (1986). [7] Steele, J...

We report on the properties of electric fields generated as a result of electron irradiation of dielectrics in a low vacuum scanning electron microscope. Individual field components produced by ~i! ionized gas molecules located outside the sample surface and ~ii! subsurface trapped charge were detected by measurements of changes in ~i! primary electron landing energy and ~ii! secondary electron...

The recently introduced helium ion microscope (HIM) is capable of imaging and fabrication of nanostructures thanks to its sub-nanometer sized ion probe [1,2]. The unique interaction of the helium ions with the sample material provides very localized secondary electron emission, thus providing a valuable signal for high-resolution imaging as well as a mechanism for very precise nanofabrication [...