نتایج جستجو برای: esd

تعداد نتایج: 2519  

2015
Jon Barth

This paper presents electrical methods used to measure and analyze the operation of ESD protection circuits built into every lead of an Integrated Circuit (IC). These circuits clamp voltage threats to sensitive core circuits which enter through each connections to the outside world. Representative samples of each IC are tested for their ESD immunity level to insure a minimum level of protection...

2009
Cheng-Cheng Yen

Four power-rail electrostatic-discharge (ESD) clamp circuits with different ESD-transient detection circuits have been fabricated in a 0.18-μm CMOS process to investigate their susceptibility against electrical fast-transient (EFT) tests. Under EFT tests, where the integrated circuits in a microelectronic system have been powered up, the feedback loop used in the power-rail ESD clamp circuits m...

2017
Mahdi Elghazali Manoj Sachdev

Electrostatic Discharge (ESD) is one of the major reliability issues in advanced CMOS technologies. Research has shown that only I/O based ESD protection circuits are inadequate in providing necessary ESD protection. Therefore, it is important to have an effective ESD power supply clamp across the power supply rails so that the ESD event will be discharged through it and protects the circuit co...

2009
Cheng-Cheng Yen

Four power-rail electrostatic-discharge (ESD) clamp 4 circuits with different ESD-transient detection circuits have been 5 fabricated in a 0.18-μm CMOS process to investigate their sus6 ceptibility against electrical fast-transient (EFT) tests. Under EFT AQ1 7 tests, where the integrated circuits in a microelectronic system 8 have been powered up, the feedback loop used in the power-rail 9 ESD ...

2017
Yasunori Otowa Shingo Kanaji Yoshinori Morita Satoshi Suzuki Masashi Yamamoto Yoshiko Matsuda Takeru Matsuda Taro Oshikiri Tetsu Nakamura Fumiaki Kawara Shinwa Tanaka Tsukasa Ishida Takashi Toyonaga Takeshi Azuma Yoshihiro Kakeji

Background and study aims  Endoscopic submucosal dissection (ESD) for duodenal tumors results in a high delayed perforation rate due to the thinness of the duodenal wall. In most cases with perforation after duodenal ESD, additional surgery is needed due to severe peritonitis. A newly developed procedure, laparoscopic endoscopic cooperative surgery for duodenal tumors (D-LECS), may help to avoi...

2016
Ji Eun Kim Jong Bum Choi Bon-Nyeo Koo Hae Won Jeong Byung Ho Lee So Yeon Kim

Endoscopic submucosal dissection (ESD) is an advanced therapy for early gastric neoplasm and requires sedation with adequate analgesia. Lidocaine is a short-acting local anesthetic, and intravenous lidocaine has been shown to have analgesic efficacy in surgical settings. The aim of this study was to assess the effects of intravenous lidocaine on analgesic and sedative requirements for ESD and p...

2014
Håkon Hofstad Bente Elisabeth Bassøe Gjelsvik Halvor Næss Geir Egil Eide Jan Sture Skouen

BACKGROUND Stroke causes lasting disability and the burden of stroke is expected to increase substantially during the next decades. Optimal rehabilitation is therefore mandatory. Early supported discharge (ESD) has previously shown beneficial, but all major studies were carried out more than ten years ago. We wanted to implement and study the results of ESD in our community today with compariso...

2001
Ming-Dou Ker Tung-Yang Chen Tai-Ho Wang Chung-Yu Wu

A novel on-chip electrostatic discharge (ESD) protection design by using polysilicon diodes as the ESD clamp devices in CMOS process is first proposed in this paper. Different process splits have been experimentally evaluated to find the suitable doping concentration for optimizing the polysilicon diodes for both on-chip ESD protection design and the application requirements of the smart-card I...

Journal: :Microelectronics Reliability 2007
Ming-Dou Ker Wei-Jen Chang

Electrostatic discharge (ESD) protection design for mixed-voltage I/O interfaces has been one of the key challenges of system-on-achip (SOC) implementation in nanoscale CMOS processes. The on-chip ESD protection circuit for mixed-voltage I/O interfaces should meet the gate-oxide reliability constraints and prevent the undesired leakage current paths. This paper presents an overview on the desig...

2003
Ming-Dou KER Tang-Kui TSENG

A novel electrostatic discharge (ESD) protection device with a threshold voltage of 0V for complementary metal-oxide semiconductor (CMOS) integrated circuits in sub-quarter-micron CMOS technology is proposed. Quite different to the traditional ESD protection devices, such an active ESD device is originally standing in its turn-on state when the IC is zapped under ESD events. Therefore, such an ...

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