While the close link between eye movements and visual attention has often been demonstrated, recently distinct attentional modes have been associated with specific eye movement patterns. The ambient mode-serving the localization of objects and dominating early scene inspection-is expressed by short fixations and large saccade amplitudes. The focal mode-associated with the identification of obje...

Semiconductor wafer post-sawing requires full inspection to assure defect-free outgoing dies. A defect problem is usually identified through visual judgment by the aid of a scanning electron microscope. By this means, potential misjudgment may be introduced into the inspection process due to human fatigue. In addition, the full inspection process can incur significant personnel costs. This rese...

The majority of scientific papers focusing on wood classification for pencil manufacturing take into account defects and visual appearance. Traditional methodologies are based on texture analysis by co-occurrence matrix, by image modeling, or by tonal measures over the plate surface. In this work, we propose to classify plates of wood without biological defects like insect holes, nodes, and cra...