An advanced controller consisting of a feedback and feedforward part is presented to improve the performance of an atomic force microscope (AFM) enabling topography measurements at higher scan rates with a reduced measurement error. The tip–sample interaction force is held constant by an H∞-controller while the scanner is simultaneously tracked to the topography of the last recorded scan line b...

Nickel films of 150 nm thickness were deposited on 304 stainless steel and post annealed under flow of nitrogen at different temperatures. The prepared samples were corrosion tested in 1.0 M H2SO4 solution using potentiodynamic polarization technique. Crystallographic and morphological structure of the samples were analysed by X-ray diffraction XRD and atomic force microscopy AFM respectively b...

The combination of atomic force microscopy (AFM) with single-molecule-sensitive confocal fluorescence microscopy enables a fascinating investigation into the structure, dynamics and interactions of single biomolecules or their assemblies. AFM reveals the structure of macromolecular complexes with nanometer resolution, while fluorescence can facilitate the identification of their constituent par...

Recent advances in nanoscale manipulation and piconewton force detection provide a unique tool for studying the mechanical and thermodynamic properties of biological molecules and complexes at the single-molecule level. Detailed equilibrium and dynamics information on proteins and DNA have been revealed by single-molecule manipulation and force detection techniques. The atomic force microscope ...

A new experimental method is introduced in order to characterize the mechanical properties of metallic nanowires. An accurate mechanical characterization of nanowires requires simultaneous imaging using scanning electron microscope (SEM) and mechanical testing with an atomic force microscope (AFM). In this study, an AFM is located inside an SEM chamber in order to establish the visibility of th...

atomic force microscopy (afm) is a three-dimensional topographic technique with a high atomic resolution to measure surface roughness. afm is a kind of scanning probe microscope, and its near-field technique is based on the interaction between a sharp tip and the atoms of the sample surface. there are several methods and many ways to modify the tip of the afm to investigate surface properties, ...

Functionalised thiols presenting peptides found in the peptidoglycan of vancomycin-sensitive and -resistant bacteria were synthesised and used to form self-assembled monolayers (SAMs) on gold surfaces. This model bacterial cell-wall surface mimic was used to study binding interactions with vancomycin. Force spectroscopy, using the atomic force microscope (AFM), was used to investigate the speci...

In this article, the feasibility of atomic force microscope AFM scanning moiré on a cross-line diffraction grating has been studied. The AFM scanning moiré technique has been applied to measure the thermal deformation of electronic packages successfully. This technique is convenient to perform the mismatch method, also it could obtain a higher resolution than any other moiré method. © 2001 Amer...