نتایج جستجو برای: آنالیز ebsd

تعداد نتایج: 42641  

2015
Maurine Montagnat Thomas Chauve Fabrice Barou Andrea Tommasi Benoît Beausir Claude Fressengeas

We present high resolution observations of microstructure and texture evolution during dynamic recrystallization (DRX) of ice polycrystals deformed in the laboratory at high temperature (≈0.98Tm). Ice possesses a significant viscoplastic anisotropy that induces strong strain heterogeneities, which result in an early occurrence of DRX mechanisms. It is therefore a model material to explore these...

2017
Tim Maitland Scott Sitzman Hiroshi Ezawa

The term “electron backscatter diffraction” (EBSD) is now synonymous with both the scanning electron microscope (SEM) technique and the accessory system that can be attached to an SEM. EBSD provides quantitative microstructural information about the crystallographic nature of metals, minerals, semiconductors, and ceramics—in fact most inorganic crystalline materials. It reveals grain size, grai...

2015
Hung-Pin Lin Delphic Chen Jui-Chao Kuo

In this study, the grain boundary character and texture of 50% and 90% cold-rolled FePd alloy was investigated during recrystallization at 700 °C. Electron backscatter diffraction (EBSD) measurements were performed on the rolling direction to normal direction section. Kernel average misorientation (KAM) calculated from EBSD measurements was employed to determine the recrystallization fraction. ...

2017
Qiwei Shi Félix Latourte François Hild Stéphane Roux

During in-situ mechanical tests performed on polycrystalline materials in a scanning electron microscope, crystal orientation maps may be recorded at different stages of deformation from electron backscattered diffraction (EBSD). The present study introduces a novel correlation technique that exploits the crystallographic orientation field as a surface pattern to measure crystal motions. Introd...

2014
Matthew Gallaugher Nicolas Brodusch Raynald Gauvin Richard R. Chromik

Imaging magnetic domains for soft magnetic materials using scanning electron microscopy (SEM) typically requires a specially modified setup. These modifications can include higher beam acceleration voltages, modifications of the sample and detector geometry, and/or specialized detectors to detect the spin polarization of secondary electrons [1,2]. In this research, a method is presented for ima...

The formation of atoll garnet in the Ardara aureole, NW Ireland, is discussed using the textural, chemical and Electron Backscatter Diffraction (EBSD) data. Textural evidence suggests the possibility of incipient of garnet replacement from the core. In addition, the presence of staurolite and andalusite in the core of small atoll garnets as well as the occurrence of sillimanite in the core of l...

Journal: :CoRR 2015
Yu-Hui Chen Se Un Park Dennis L. Wei Gregory E. Newstadt Michael A. Jackson Jeff P. Simmons Marc De Graef Alfred O. Hero

We propose a framework for indexing of grain and sub-grain structures in electron backscatter diffraction (EBSD) images of polycrystalline materials. The framework is based on a previously introduced physics-based forward model by Callahan and De Graef (2013) relating measured patterns to grain orientations (Euler angle). The forward model is tuned to the microscope and the sample symmetry grou...

2017
J. Goulden A. Bewick P. Trimby

Electron backscatter diffraction EBSD is a powerful technique applicable to a range of microstructural analyses, including texture, grain size, boundary characterization, phase distribution and inter-phase orientation relationships. The technique is suited to solving an increasing range of analytical problems on the um to mm scale. However, best results are only obtained with a good understandi...

2006
J. Müller D. Balzar

X-ray diffraction (XRD) and electron backscatter diffraction (EBSD) are commonly used to perform texture analysis of thin films. However, due to principle differences in data acquisition these techniques can yield disagreeing results. In this paper, we aim to highlight possible error sources with given examples for aluminum and copper thin films. INTRODUCTION Texture in materials has a large in...

Journal: :JOURNAL OF THE JAPAN WELDING SOCIETY 2008

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