نتایج جستجو برای: yield component

تعداد نتایج: 797931  

Journal: :Journal of dairy science 2006
N P P Macciotta D Vicario A Cappio-Borlino

Multivariate factor analysis and principal component analysis were used to decompose the correlation matrix of test-day milk yields of 48,374 lactations of 21,721 Italian Simmental cows. Two common latent factors related to level of production in early lactation and lactation persistency, and 2 principal components associated with the whole lactation yield and persistency were obtained. Factor ...

Journal: :پژوهش های زراعی ایران 0
شیرین قاضیان تفریشی امیر آینه بند حسین توکلی سعید خاوری خراسانی محمد جلینی

a randomized complete block design with four replications and a split plot arrangement was conducted in 2010, in order to study the effect of limited irrigation on yield and yield component of sweet corn. water levels were (100%, 80%, and 60% replacement of plant water requirement) which served as main plots. subplot was a factorial arrangement of three different sweet corn varieties (merit, ob...

نجفی‌پور, عظیمه, مجیدی, محمد مهدی ,

Little is known about genetic variation of seed related traits and their association with forage characters in sainfoin. In order to investigate the variation and relationship among seed yield and its components, 93 genotypes from 21 wild and cultivated species of genus Onobrychis were evaluated using a randomized complete block design with four replications at Isfahan University of Technology ...

Journal: :Journal of Agricultural Sciences, Belgrade 2021

The effects of four sulphur levels: S0, S1, S2 and S3, including 0, 12, 24 36 kg S ha-1, respectively, along with 115 N ha-1 were studied on yield-related traits oilseed rape (Brassica napus L.). significant variance treatments was determined for plant height, yield component characters, seed oil content. application significantly increased most the compared to S0 level. S3 (36 ha-1) treatment ...

Journal: :International Journal of Current Microbiology and Applied Sciences 2017

2010
Michael E. Long David L. Farnsworth

A model is created for the number of integrated circuits that are good from each wafer on which they are fabricated. The goal is to separate the random or common cause loss from the systematic or special loss. The random loss from this type of process is modeled so that false alarms indicating systematic loss are less likely to occur and so that the structure of the systematic loss can be deter...

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