The generation of additional interface traps in the pinch-off region and the threshold voltage shift due to hotelectron stressing have been shown to cause 1-3 orders of magnitude increase in the flicker noise density. This flicker noise “overshoot” can easily degrade the performance/resolution of analog circuits by 6-18dB. An improved flicker noise model which is capable of accurately predictin...

Electric arc furnaces (EAFs) are regarded as one of the major sources of voltage fluctuation in power systems which can contribute to a phenomenon known as flicker. One of the most convenient ways to mitigate flicker is employing static VAr compensators (SVCs). By employing prediction models to forecast EAF reactive power SVC performance can be improved very noticeably. In this paper a Grey sys...

Permeant ions can have significant effects on ion channel conformational changes. To further understand the relationship between ion occupancy and gating conformational changes, we have studied macroscopic and single-channel gating of BK potassium channels with different permeant monovalent cations. While the slopes of the conductance-voltage curve were reduced with respect to potassium for all...

By means of intracellular microelectrode techniques, we have measured the dynamics of the several processes which translate light stimulation into spike activity in the Limulus eye. The transductions from light to voltage and from voltage to spike rate, and the lateral inhibitory transduction from spike rate to voltage, we have characterized by transfer functions. We have checked the appropriat...

In order to solve the problem of voltage flicker produced by electric arc furnace (EAF) operation, it is a prerequisite to analyze the characteristics of voltage time series acquired from AC EAF power supply grid and to conduct voltage prediction based on chaos theory. In this paper, the voltage time series is firstly reconstructed in phase space to determine optimal delay time and embedding di...