نتایج جستجو برای: vision metrology
تعداد نتایج: 132285 فیلتر نتایج به سال:
To help identify the strengths of proposed software measurement methods, this paper proposes an analytical approach based on metrology concepts documented in the ISO International Vocabulary of Basic and General Terms in Metrology. This approach is illustrated with a case study using one specific functional size measurement method recognized as an ISO standard: COSMIC-FFP (ISO 19761). The case ...
Direct metrology of coherent short-wavelength beamlines is important for obtaining operational beam characteristics at the experimental site. However, since beam-time limitation imposes fast metrology procedures, a multi-parametric metrology from as low as a single shot is desirable. Here a two-dimensional (2D) procedure based on high-resolution Fresnel diffraction analysis is discussed and app...
Modern metrology is the result of more than 200 years of development that began with the creation of the decimal metric system at the time of the French Revolution and the beginning, at about the same time, of mass production using interchangeable parts. This article traces these developments and describes how world metrology is organized today and gives examples of applications of metrology sh...
A method capable of delivering relative optical path length metrology with nanometer precision is demonstrated. Unlike conventional dual-wavelength metrology, which employs heterodyne detection, the method developed in this work utilizes direct detection of interference fringes of two He-Ne lasers as well as a less precise stepper motor open-loop position control system to perform its measureme...
I should like to bring to the attention of the many readers of the Journal of Research of the National Institute of Standards and Technology the establishment of the Slovak Metrological Society (SMS). SMS came into being on October 16, 1990, as the result of a special founding Congress held in DT Zilina with 137 delegates from the whole of Slovakia in attendance. It brings together individuals ...
The ISO International Vocabulary of Basic and General Terms in Metrology (VIM) represents the international consensus on a common and general terminology of metrology concepts. However, until recently, it was not usual practice in software engineering measurement to take into account metrology concepts and criteria in the design of software measures. Using the ISO 9126-4 Technical Report on the...
Optical metrology provides full field, noncontact, precise measurement of various physical parameters of materials, structures, and devices. These properties include kinematic parameters (displacement, velocity, and acceleration), deformation parameters (strains, curvature, and twist), surface parameters (shape and roughness), and mechanical properties of materials (Young’s modulus, Poisson’s r...
1. Foundational metrology and measurement issues 2. Accurate data, total quality systems, kaizen, lean, six sigma 3. Metrology and inspection system services in quality 4. Historical background on metrology 5. Form, fit, finish and function, geometric underpinnings 6. Foundational metrological and measurement issues 7. Basic measurable features in geometric dimensioning 8. Basic principles and ...
Accurate metrology techniques for semiconductor devices are indispensable controlling the manufacturing process. For instance, dimensions of a transistor’s current channel (fin) an important indicator device’s performance regarding switching voltages and parasitic capacities. We expand upon traditional 2D analysis by utilizing computer vision full-surface reconstruction. propose data-driven app...
This presentation offers some thoughts on the emergence (that is essentially to say the commercial acceptance and exploitation) of close range digital photogrammetric systems. The discussion is restricted to systems based on standard photogrammetric processes involving digital frame imagery. Systems are classified into three tiers which are distinguished not only by accuracy and cost, but also ...
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