نتایج جستجو برای: upset zone

تعداد نتایج: 116497  

2014
M. J. Wirthlin H. Takai A. Harding

This paper summarizes the radiation testing performed on the Xilinx Kintex-7 FPGA in an effort to determine if the Kintex-7 can be used within the ATLAS Liquid Argon (LAr) Calorimeter. The Kintex-7 device was tested with wide-spectrum neutrons, protons, heavy-ions, and mixed high-energy hadron environments. The results of these tests were used to estimate the configuration ram and block ram ups...

2017
G. Cardarilli A. Leandri P. Marinucci M. Ottavi S. Pontarelli M. Re P. A. Ferreyra C. A. Marques R. T. Ferreyra

Due to advance technologies transistor size shrinks which makes the devices more vulnerable to noise and radiation effect. This affects the reliability of memories. Built-in current sensors (BICS) have been success in the case of single event upset (SEC). The process is taken one step further by proposing specific error correction codes to protect memories against multiple-bit upsets and to imp...

2004
Edward A. Bender

Let's look at the simplest case first: two competitors, say the Comets and the Meteors. If they play each other enough, the better one will win more games and so we'll know which is better. To illustrate, suppose the Comets would win a game 55% of the time. • If they play once, then there is a 45% chance the Meteors would win, a minor upset since the Comets are slightly better. • If they play t...

2000
Earl Fuller Michael Caffrey Anthony Salazar Carl Carmichael Joe Fabula

Orbital remote sensing instruments and systems can benefit from high performance, adaptable components. Field programmable SRAM-based gate arrays (FPGAs) are usually the chosen platform for real-time reconfigurable computing. This technology is driven by the commercial sector, so devices intended for the space environment must be adapted from commercial products. Total ionizing dose (TID), heav...

Journal: :Archives of suicide research : official journal of the International Academy for Suicide Research 2010
Stephen S O'Connor David A Jobes Timothy W Lineberry J Michael Bostwick

The Suicide Upsetness Assessment (SUA) was used to measure the phenomenological experience of emotional upset during active states of suicidal ideation. Forty-nine inpatients with a history of suicide-related behaviors at a Midwestern inpatient psychiatric hospital completed a battery of assessments during their inpatient hospital stay. After reviewing theories regarding suicidality by the rese...

1999
J Fulcher G Hall M Raymond J Wyss A Kaminski

The microstrip tracker for the CMS experiment at the LHC will be read out using radiation hard APV chips. During high luminosity running of the LHC the tracker will be exposed to particle fluxes up to 10 cm s. This high rate of particles introduces a concern that the APV could occasionally suffer from Single Event Upset (SEU). In order to evaluate the expected upset rate the APV was run under c...

2003
J. J. Wang

Total ionizing dose (TID) effects and single event effects (SEE) in antifuse-, Flash-, and SRAM-based field programmable gate arrays (FPGAs) are reviewed. There is a brief discussion of the programmable element impact on the FPGA architecture. In the following sections, most radiation data are from antifuse-based FPGAs. The basic TID mechanisms are introduced and used to explain the anomalies i...

Journal: :IEEE Transactions on Emerging Topics in Computing 2021

This paper presents two novel low cost, double-and-triple-node-upset tolerant latch designs. First, a cost and double-node-upset (DNU) completely (LCDNUT) design is proposed. The mainly comprises storage module (SM) feeding back to 3-input C-element. SM consists of eight input-split inverters. Since the inputs C-element cannot be simultaneously flipped, tolerates any DNU in SM. When single node...

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