نتایج جستجو برای: tin thin films

تعداد نتایج: 194721  

2010
H. Lorenz O. I. Lebedev G. Van Tendeloo C. Rameshan

Structure, morphology and composition of different tin oxide and germanium oxide thin film catalysts for the methanol steam reforming (MSR) reaction have been studied by a combination of (High-resolution) Transmission Electron Microscopy, Selected Area Electron Diffraction, Darkfield imaging and Electron Energy-Loss Spectroscopy. Deposition of the thin films on NaCl(001) cleavage faces has been...

2003
J. Zhang J. Q. Hu

This paper presents the possibilities and properties of Indium tin oxide (ITO)covered quartz crystal as a NOx toxic gas-sensor. The starting sol-gel solution was prepared by mixing indium chloride dissolved in acetylacetone and tin chloride dissolved in ethanol (0-20% by weight). The ITO thin films were deposited on the gold electrodes of quartz crystal by spin-coating technique and subsequentl...

2017
Grzegorz Greczynski Lars Hultman

Self-cleansing of transition metal nitrides is discovered to take place during ultrahigh vacuum annealing of TiN, NbN, and VN thin films. Native oxide layers from air exposure disappear after isothermal anneal at 1000 °C. Also, for TiN, the Ti 2p and N 1s X-ray photoelectron spectra (XPS) recorded after the anneal are identical to those obtained from insitu grown and analyzed epitaxial TiN(001)...

Ali Reza Khodayari Ebrahim Asl Soleimani, Negin Manavizadeh Sheyda Bagherzadeh

The improvement of the physical properties of Indium Tin Oxide (ITO) layers is quite advantageous in photovoltaic applications. In this study the ITO film is deposited by RF sputtering onto p-type crystalline silicon (c-Si) with (100) orientation, multicrystalline silicon (mc-Si), and glass substrates coated with ZnO and annealed in vacuum furnace at 400°C. Electrical, optical, structural a...

2015
Xiaolu Pang Liqiang Zhang Huisheng Yang Kewei Gao Alex A. Volinsky

Morphology, structure, residual stress, and surface energy of magnetron-sputtered titanium nitride (TiN) thin films, deposited at 300 C with a thickness in the 0.5-1.7 lm range, were characterized. Film microstructure, the origin of residual stress, and its effect on the surface energy were analyzed. The grain size increased with the film thickness. X-ray diffraction showed (200) to (111) prefe...

2014
Anders Eriksson Olof Tengstrand Jun Lu Jens Jensen Per Eklund Johanna Rosén Ivan Petrov Joseph E Greene Lars Hultman J. E. Greene L. Hultman A. O. Eriksson J. Lu P. Eklund J. Rosén

Thin films consisting of TiN nanocrystallites encapsulated in a fully percolated SiNy tissue phase are archetypes for hard and superhard nanocomposites. Here, we investigate metastable SiNy solid solubility in TiN and probe the effects of surface segregation during growth of TiSiN films onto substrates that are either flat TiN(001)/MgO(001) epitaxial buffer layers or TiN(001) facets of length 1...

2014
M. M. Ombaba L. V. Jayaraman M. S. Islam

Articles you may be interested in Microstructure factor and mechanical and electronic properties of hydrogenated amorphous and nanocrystalline silicon thin-films for microelectromechanical systems applications GaN epitaxial films grown by hydride vapor phase epitaxy on polycrystalline chemical vapor deposition diamond substrates using surface nanostructuring with TiN or anodic Al oxide Mechanis...

2017
Kunyu Zhao Huizhu Yu Jian Zou Huarong Zeng Guorong Li Xiaomin Li

In this work, we have studied the microstructures, nanodomains, polarization preservation behaviors, and electrical properties of BiFe0.95Mn0.05O₃ (BFMO) multiferroic thin films, which have been epitaxially created on the substrates of SrRuO₃, SrTiO₃, and TiN-buffered (001)-oriented Si at different oxygen pressures via piezoresponse force microscopy and conductive atomic force microscopy. We fo...

2017
Satendra Singh Satish Kumar

Amorphous Se40-xTe60Snx glassy alloys have been synthesized by thermal evaporation technique under high vacuum conditions (~ 10 -5 torr). The optical spectra of amorphous Se40-xTe60Snx (x = 0, 2, 4, 6, 8) thin films have been measured by a double beam UV-VIS-NIR computer controlled spectrophotometer over the range of 200-3000 nm. Swanepole technique has been used to calculate the optical consta...

Journal: :Physical review letters 2000
Akimov Sirenko Clark Hao Xi

We have studied electric-field-induced Raman scattering in SrTiO3 thin films using an indium-tin-oxide/SrTiO3/SrRuO3 structure grown by pulsed laser deposition. The soft mode polarized along the field becomes Raman active. Experimental data for electric-field-induced hardening of the soft modes and the tuning of the static dielectric constant are in agreement described by the Lyddane-Sachs-Tell...

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