In this bachelor’s thesis an approach for Flow Systems in UPPAAL is introduced. This approach is then used to implement a model for an industry use-case: the pre-production machine Lithography Wafer Scanner System by company A. It is during this implementation concluded that this model is not valid. Next, a tool is written to generate Gantt charts from traces of arbitrary timed UPPAAL models. T...

Identification of the assignable causes of process variability and the restriction and elimination of their influence are the main goals of statistical process control (SPC). Identification of these causes is associated with so called tests for special causes or runs tests. From the time of the formulation of the first set of such rules (Western Electric rules) several different...

Control chart is the most well-known chart to monitor the number of nonconformities per inspection unit where each sample consists of constant size. Generally, the design of a control chart requires determination of sample size, sampling interval, and control limits width. Optimally selecting these parameters depends on several process parameters, which have been considered from statistical and...

For signalling alarms sooner when the dispersion of a multivariate process is “increased”, a multivariate control chart for Phase II process monitoring is proposed as a supplementary tool to the usual monitoring schemes designed for detecting general changes in the covariance matrix. The proposed chart is constructed based on the one-sided likelihood ratio test (LRT) for testing the hypothesis ...