Robust, high yield IC design requires statistical simulation, and therefore statistical models. Simple “fast” and “slow” sets of model parameters are not sufficient to predict the manufacturing variations of all measures of circuit performance for arbitrary circuit topologies, device geometries, and biases. This paper describes an accurate and efficient approach to statistical modeling and char...

negative and therefore the fluctuation of the readings reduced to normal pressure is only statistical. There is no indication of a systematic variation due to causes other than variation of pressure. Since the statistical fluctuation is large it cannot be excluded that systematic variations with amplitudes much smaller than the barometric fluctuation occur but are masked by the statistical fluc...

We introduce some notions of variation using the statistical convergence with respect to power series method. By use variation, we prove criterions that can be used verify without limit value. Also, results give relations between P-statistical variations are studied.