in this study, ultrafine grained 2024 al alloy based b4c particles reinforced composite was produced by mechanical milling and hot extrusion. mechanical milling was used to synthesize the nanostructured al2024 in attrition mill under argon atmosphere up to 50h. a similar process was used to produce al2024-5%wt. b4c composite powder. to produce trimodal composites, milled powders were combined w...

Electron microscopy of materials in a gaseous environment has its origins as far back as about the 1950s for the transmission electron microscope (TEM), later followed by developments for the scanning electron microscope (SEM). Focusing on the latter, this review outlines the history and commercial development of the technology, culminating in the environmental SEM (ESEM), and the techniques fo...

Bismuth oxide (Bi2O3) nanorods was prepared via one pot sol-gel method using Bi(NO3)3.5H2O and starch (as template) in water under hydrothermal condition followed by calcination at 320˚C within 3 h. The resultant solid product was characterized by scanning electron microscope (SEM), X-ray diffraction (XRD), thermogravimetry (TGA), and FTIR techniques. Based on the obtained results, the formatio...

This paper describes analytical and digital photogrammetric methods of a stereo pair of scanning electron microscope (SEM) photographs. Analytical method was applied to a triplet of stereo SEM photographs of an impression left by the diamond indenter of Vicker's hardness tester. The height error of the three dimensional measurement was ±5% and the precision is sufficient for surface shape analy...

in this research nanoparticles of nickel (ii) chloride were synthesized and characterized using fourier transform infrared (ft-ir) spectra. nanoparticles of nickel (ii) chloride were prepared by using of ball mill device. a ball mill is one kind of grinding machine, and it is a device in which media balls and solid materials (the materials to be ground) are placed in a container. in the researc...

At the University of Karlsruhe, a flexible micromanipulation station based on high-precise piezo-driven microrobots has been developed. Providing a flexible tool in several application fields in the micro world the robots operate either on the stage of an automated light optical microscope or inside the vacuum chamber of a scanning electron microscope (SEM). In order to automate manipulating ta...

Recent computational methods of wafer defect detection often inspect Scanning Electron Microscope (SEM) images of the wafer. In this paper, we propose a kernel-based approach to multichannel defect detection, which relies on simultaneous acquisition of three different images for each sample in an SEM tool. The reconstruction of a source patch from reference patches in the three channels is cons...

The preparation of hard material samples with the necessary size and shape is critical to successful material analysis. X-ray nanotomography requires that samples are sufficiently thin for X-rays to pass through the sample during rotation for tomography. One method for producing samples that fit the criteria for X-ray nanotomography is focused ion beam/scanning electron microscopy (FIB/SEM) whi...

The scanning electron microscope (SEM) is a versatile high-resolution microscopy tool, and perhaps the most widely used imaging platform across many engineering and scientific fields [1]. Within the last decade, another microscopy technique based on a gaseous field ionization source, utilizing Helium and Neon ions has been introduced [2]. While the popularity of the SEM is hardly challenged by ...