نتایج جستجو برای: ray diffraction pattern

تعداد نتایج: 665923  

2006
G. Liang Z. Tang H. Fang K. Salama

To clarify the inconsistency between calculated and existing experimental X-ray diffraction (XRD) pattern for dicopper magnesium (MgCu2) nd to identify the impurity phase in Cu-sheathed MgB2 superconductors, polycrystalline MgCu2 samples were synthesized and studied by XRD easurement. The XRD result shows that the (2 2 0), (4 2 2), (6 2 0), and (6 4 2) reflection lines, which are missing from t...

In this research we report synthesis of new Barium- Cobalt precursor complex with 2,6- pyridine dicarboxylic acid (dipic).Thecomplex[Ba(H2O)6][Co(dipic)2[(1)has been characterized using spectral methods (FT-IR, UV–Vis),elemental analysis and Cyclic voltammetric (CV) method. Also in this study we report thermal decomposition of inorganic precursor complex of (1).Characterization of the binary ox...

بخشی, سعیدرضا, برهانی, غلامحسین, خواجه لکزای, محمد,

In this study, synthesis of silicon nitride by mechanical alloying and the effects of important parameters of milling time and heat treatment temperature, time and rate are presented. Silicon micro powder and nitrogen gas were used as precursor materials. Synthesized phases, morphology and particle size were investigated by X-ray diffraction pattern (XRD) and Field emission scanning electron mi...

Journal: :international journal of bio-inorganic hybrid nanomaterials 2015
h. zahedi a. mollahosseini e. noroozian

according to circumstance of kerman sarcheshmeh cooper complex that its anode slime is mainly consisted of cu, ag, au, pb and se. in this work, recovery of silver from anode slime and subsequent synthesis of silver nanoparticles from leaching solution was made. silver was separated from anode slime by using of hno3 and hcl. x-ray fluorescence spectroscopy (xrf) was used to characterize anode sl...

2007
L. K. Bekessy N. A. Raftery S. Russell

The nature of the scattering pattern for silicon 004 wafer is described. At incidence angles (ω) set close to the expected diffraction condition of ω = θh`k`l` αhkl,h`k`l` (hkl are the planes parallel to the wafer surface and αhkl,h`k`l` is the interfacial angle between hkl and another set of diffracting planes h’k’l’), an anomalous kind of scattering has been observed. There is a broad weak fe...

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