نتایج جستجو برای: ray diffraction measurement then
تعداد نتایج: 1484604 فیلتر نتایج به سال:
We have developed a high-throughput x-ray characterization system, which can rapidly screen structure, composition and x-ray scintillation of combinatorial materials libraries using energy-dispersive x-ray diffraction, x-ray fluorescence, and x-ray photoluminescence. This system consists of an x-ray source, a polycapillary x-ray lens, one or two x-ray energy detectors, and a fiber optic spectro...
Nano-crystalline particles of CeO2 have been synthesized by a low temperature chemical precipitation method. The precursor materials used in this research were Ce(NO3)3.6H2O, NaOH and diethylene glycol as surfactant. X-ray powder diffraction results showed that face centered cubic CeO2 nanoparticles with crystalline size in nanometer scale were formed. Scanning electron microscopy measurement s...
Polar organic nonlinear optical material, L-tartaric acid single crystals have been grown from slow evaporation solution growth technique. Single crystal X-ray diffraction study indicates that the grown crystal crystallized in monoclinic system with space group P21. Crystalline perfection of the crystal has been evaluated by high resolution X-ray diffraction technique and it reveals that the cr...
We describe a novel interferometer design suitable for highly accurate measurement of wave-front aberrations over a wide range of wavelengths, from visible to x ray. The new design, based on the point diffraction interferometer, preserves the advantages of the conventional point diffraction interferometer but offers higher efficiency and improved accuracy through phase shifting. These qualities...
In the current paper,Nanostructured Nickel oxide (NiO) were synthesized by co-precipitation method using Nickel(II) Chloride Hexahydrate (NiCl2.6H2O) and sodium hydroxide (NaOH) as starting material. Structural, optical and magnetic properties of nanostructures were characterized by X-ray diffraction (XRD), scanning electron microscopy (SEM), Atomic force microscope (AFM), UV–Vis absorption; Fo...
We report the wave-front phase measurement of high-order harmonics employing point-diffraction interferometry. The high-order harmonics generated in a gas-filled hollow tube showed excellent spatial coherence over nearly the whole cross section of the harmonic beams. Using this coherent harmonic source in the extreme-ultraviolet-soft-x-ray region, we have demonstrated the operation of a point-d...
Additive manufacturing (AM) techniques can produce complex, high-value metal parts, with potential applications as critical parts, such as those found in aerospace components. The production of AM parts with consistent and predictable properties requires input materials (e.g., metal powders) with known and repeatable characteristics, which in turn requires standardized measurement methods for p...
The full strain and stress tensor determination in a triaxially stressed single crystal using X-ray diffraction requires a series of lattice spacing measurements at different crystal orientations. This can be achieved using a tunable X-ray source. This article reports on a novel experimental procedure for single-shot full strain tensor determination using polychromatic synchrotron radiation wit...
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