common use is the distinction into two (abstract) fault models: A new fault modelling scheme for integrated analogue general the "Single Hard Fault Model (SHFM)" and the CMOS circuits referred to as Local Layout Realistic Fault Mapping is introduced. It is aimed at realistic fault 1 assumptions prior to the final layout by investigating typical “local” layout structures of analogue designs. Spe...

A new method to fault diagnosis in combinational circuits is presented. We consider multiple stuck-at-(0/1) faults at the gate level. We introduce the concept of frontier faults which reduce the number of faults to consider and are equivalent to the set of all multiple faults; however, we do not enumerate all the possible multiple faults. The diagnosis is performed in two consecutive steps. For...

Model based diagnostic systems have generally avoided the issue of multiple failure diagnosis due to the computational complexity of covering all possible multiple faults and still providing an efficient diagnostic strategy. Optimization of decision trees is already known to be NP-complete, and the number of combinations of multiple faults just serves to exacerbate the problem. Nevertheless, mo...

With the increasing complexity of VLSI devices, more complex faults have appeared. Many methods for diagnosing the single stuck-at fault have been studied. Often multiple defects on a failing chip better reflect the reality. So, we propose an efficient diagnosis algorithm for multiple stuck-at faults. By using vectorwise intersections as an important metric of diagnosis, the proposed algorithm ...

In designing a self-checking processor, it is essential to recognize the types of failures that are most probable. Matching the checking techniques with the type of faults that are expected to occur should yield the best result with the least amount of hardware. The microprogram control will consist of integrated circuits: large-scale integration (LSI) for the memory and small-scale integration...

This work proposes a new methodology for sensor fault detection and localization using principal component analysis (PCA). A new index is proposed in order to detect simple and multiple faults affecting the dependent and independent process variables. A new iterative selection method of principal component number is presented. This method determines a model allowing the detection of faults with...

In this paper, we show two process allocation schemes to tolerate multiple faults when the primary-backup replication method is used. The first scheme, called multiple backup scheme, is running multiple backup processes for each process to tolerate multiple faults. The second scheme, called regenerative backup scheme, is running only one backup process for each process, but re-generates backup ...