نتایج جستجو برای: model test

تعداد نتایج: 2761620  

2011
Keld Bødker Jan Recker

Process modeling is an emergent area of Information Systems research that is characterized through an abundance of conceptual work with little empirical research. To fill this gap, this paper reports on the development and validation of an instrument to measure user acceptance of process modeling grammars. We advance an extended model for a multi-stage measurement instrument development procedu...

Journal: :Softw. Test., Verif. Reliab. 1997
Thomas Ericson Anders Subotic Stig Ursing

The software testing state of practice is not as good as it ought to be. To reduce the gap between the state of practice and the state of the art, improvement of software testing is necessary. Existing improvement models focus too little on, or lack important aspects of, software testing. Therefore a new model is required. This paper describes a test improvement model called TIM. The model func...

2001
Hung Tran Marsha Chechik

Testing in the software industry is, in general an ad hoc task. There are guidelines to follow but in most cases do not cover sufficient portions of the software product. Recent work has been done to automatically generate test cases such that designers are no longer responsible for designing the test cases but ensuring that the specification of the software is valid. These formal specification...

2003
Rosa Reinosa Carlos Michel

The selection of an adequate set of test and inspection techniques to verify the quality and functionality of a product, as well as, the integrity of the manufacturing process can be a complex task. This selection process would normally require a detailed technical assessment on the effectiveness of each test technique, trade-off analysis among alternate test techniques/platforms and an economi...

Journal: :Electronics 2022

In this work, we use statistical concepts to evaluate the joint probability distribution of manufacturing and test parameters estimate future trend wafer yield. Owing difference between development speeds testing technology technology, capability wafers is far behind semiconductor. Therefore, with advancement in yield loss caused by tester inaccuracy has become an important problem. article, pr...

2013
Krzysztof Wegner Ying Chen Sehoon Yea

Draft 1 of 3D-HEVC Test Model Description Ed. Notes (D0) (based on N12744)  (3D08/JCT3V-A0126) (T,N) Simplified disparity derivation  (3D16) Moved 3D-tool related flags from SPS to VPS, removal camera parameters  (3D09/JCT3V-A0049) (N) Inter-view motion prediction modification  (3D13/JCT3V-A0119) (T) VSO depth fidelity  (3D07/JCT3V-A0070) (T,N) Region boundary chain coding for depth maps ...

2013
Krzysztof Wegner Ying Chen Sehoon Yea

Draft 2 of 3D-HEVC Test Model Description Ed. Notes (WD2) (based on JCT3V-A1005)  Accepted changes and marked delta to base spec  (3DC-GT2) Editorial improvements, small corrections  (3DC-CY) Editorial improvements, small corrections  (MVS-02/JCT3V-B0046) Treatment of inter-view pictures as long termreference pictures  (3DE-11) Revised text related to 3Dn-01  (3Dn-01/m23639) Results on mo...

Journal: :Electr. Notes Theor. Comput. Sci. 2009
Thierry Jéron

This paper addresses the problem of model-based off-line selection of test cases for testing the conformance of a black-box implementation with respect to a specification, in the context of reactive systems. Efficient solutions to this problem have been proposed for LTS finite-state models, based on the ioco conformance testing theory. In this paper, the approach is extended for infinite-state ...

Journal: :Journal of the Society of Naval Architects of Japan 1975

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