Abstract Microstructure characterization and reconstruction (MCR) is an important prerequisite for empowering accelerating integrated computational materials engineering. Much progress has been made in MCR recently; however, the absence of a flexible software platform it difficult to use ideas from other researchers develop them further. To address this issue, work presents MCRpy as easy-to-use...

Nano-structured TiO(2) thin film has been successfully fabricated at room temperature. Using a quarter wavelength characterization method, we have measured the acoustic impedance of this porous film, which can be adjusted from 5.3 to 7.19 Mrayl by curing it at different temperatures. The uniform microstructure and easy fabrication at room temperature make this material an excellent candidate fo...

The microstructure plays a crucial role for steel semi-solid forming process, and particularly for the steel thixoforging process, since it determines the thixotropic flow behavior of materials in the semi-solid state. Therefore, it is necessary to well understand the microstructure evolution during high speed heating and forming. Classically, it is investigated on a solid material quenched fro...

The microstructures of copper chips created by plane strain machining at ambient temperature have been analyzed using transmission electron microscopy (TEM) and orientation imaging microscopy (OIM). The strain imposed in the chips was varied by changing the tool rake angle. Characterization of orthogonal faces of the chips showed the microstructure to be essentially uniform through the chip vol...

Electron backscatter diffraction (EBSD) has evolved into a well-established tool for microstructural characterization by providing quantitative information on crystallographic orientation and phase content and distribution. The rapid acceptance of EBSD as an analytical technique has been driven, in part, by the highly informative contrasts used to create different micrographs which effectively ...

Interpretation of the massive amount of data (i.e,. microstructure images comprising millions of voxels) produced by emerging three-dimensional (3-D) characterization methods of polycrystalline materials, require very effi cient models. Such models should be able to use direct input from those images to predict mechanical response. In this work we present a formulation based on fast Fourier tra...

We have grown and compared microstructures and dielectric properties of PNZST thin films prepared on two different substrates by sol /gel methods. To ensure a complete single-phase perovskite PNZST thin film, a capping layer of PbO must be added to the top surface of the thin film before final heat treatment. Microstructure characterization was examined with X-ray diffraction, scanning and tran...