The Target Group has recently begun to apply ion beam sputter deposition for target pusher layer fabrication. Metal deposition on both levitated and stalk-mounted fusion targets has been demonstrated. We believe this is the first application of this versatile deposition technique to IF target pusher layerfabrication. Our initial results indicate that ion beam sputtering is far more controllable...

A new scheme for the two-dimensional cooling of ion beams in storage rings is suggested in which ions interact with a counterpropagating broad-band laser beam. The interaction region in the direction of the ion movement is much less then the wavelength of the ion betatron oscillations. The laser beam in the orbit plane has sharp flat edge directed to the ion beam and the width of the laser beam...

To date, nano-and micro-structuring has commonly been implemented by a combination of specifically optimized processes of electron-beam lithography and reactive ion etching, thus limiting the range of materials that can be structured to only a few. In this talk we will introduce focused ion beam (FIB) milling as an emerging technology that enables fast, reliable and well-controlled nanometer-si...

Temperature dependent He-irradiation-induced ion-beam mixing between amorphous silicon oxycarbide (SiOC) and crystalline Fe was examined with a transmission electron microscope (TEM) and via Rutherford backscattering spectrometry (RBS). The Fe marker layer (7.2 ± 0.8 nm) was placed in between two amorphous SiOC layers (200 nm). The amount of ion-beam mixing after 298, 473, 673, 873, and 1073 K ...

introduction: natural organic matters (noms) existing in water resources led to various problems such as formation of disinfectant by-products (dbps). humic matters like humic acid (ha) are component of noms that should be removed from water. advanced oxidation process (aops) is one of the noms removal methods. the aim of this study was to survey the degradation of humic acid by electron beam i...

A Li vapor cell has successfully converted a He ion beam to a He ion beam by double charge exchange reaction. Emittance of the He ion beam and that of the He beam were independently measured to study emittance growth during the passage of the charge exchange cell. Each component was seperated by electrostatic deection after passing through a beam shaping slit. The result had shown that the emi...

We present a new nanoscale imaging technique based on detecting backscattered ions from a lithium focused ion beam (FIB). Scanning ion microscopes are of general interest as they provide image contrast that differs from scanning electron microscopes (SEM), as has been demonstrated with the traditional gallium FIB and the helium ion microscope [1]. Like helium, the low mass of lithium makes it i...