نتایج جستجو برای: internal faults

تعداد نتایج: 254936  

Journal: :IEEE Trans. Computers 1988
Paul Ammann John C. Knight

Crucial computer applications require extremely reliable software. For a typical system, current proof techniques and testing methods cannot guarantee the absence of software faults, but careful use of redundancy may allow the system to tolerate them. Existing methods to provide fault tolerance at execution time rely on redundant software written to the same specifications. Such techniques use ...

1991
Anura P. Jayasumana Yashwant K. Malaiya Rochit Rajsuman

CMOS circuits present severe problems in the detection of transistor stuck-open faults. In CMOS circuits, the transistor stuck-open (s-open) faults cause sequential behavior, and hence twoor multipattern sequences are used to detect s-open faults. Furthermore, twoor multipattern sequences may fail to detect a fault in several situations. The available methods for augmenting CMOS gates require a...

Low- impedance transformer ground differential relay is a part of power transformer protection system that is employed for detecting the internal earth faults. This is a fast and sensitive relay, but during some external faults and inrush current conditions, may be exposed to maloperation due to current transformer (CT) saturation. In this paper, a new intelligent transformer ground differentia...

Journal: :IACR Cryptology ePrint Archive 2016
Colin O'Flynn

Causing a device to incorrectly execute an instruction or store faulty data is well-known strategy for attacking cryptographic implementations on embedded systems. One technique to generate such faults is to manipulate the supply voltage of the device. This paper introduces a novel technique to introduce those supply voltage manipulations onto existing digital systems, requiring minimal modific...

Journal: :J. Electronic Testing 1994
Kanad Chakraborty Pinaki Mazumder

Static random-access memories (SRAMs) exhibit faults that are electrical in nature. Functional and electrical testing are performed to diagnose faulty operation. These tests are usually designed from simple fault models that describe the chip interface behavior without a thorough analysis of the chip layout and technology. However, there are certain technology and layout-related defects that ar...

2004
Michele L. Cooke Susan Murphy

[1] We examine the work energy budget of actively deforming fault systems in order to develop a means of examining the systemic behavior of complex fault networks. Work done in the deformation of a faulted area consists of five components: (1) work done against gravity in uplift of topography (Wgrav); (2) internal energy of the strained host rock (Wint); (3) work done resisting friction during ...

Journal: :International Journal of Electronics and Electical Engineering 2013

2010
Carola Artero marc Nogueras Juanjo Dañobeitia Antoni mànuel

In this paper is described the system that controls the connected devices in a subsea observatory. The control system is constantly monitoring the internal and external components of the observatory detecting operating faults and acting automatically in consequence.

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