ABSTRACT This paper presents a design of a high speed Comparator design using 65nm digital CMOS technology on Cadence Virtuoso Design Tool. The proposed FLASH ADC Design consists of fully differential topology. The first stage provides a Voltage Divider circuit and the second stage is Comparator Design having high sampling frequency tolerance, and the high efficient common drain circuit provide...

The performance of Flash Analogto-Digital converter is greatly influenced by the choice of Comparator and Thermometer-toBinary encoder design. The work describes the design and pre-simulation of a , 3bit and an 4bit analog to digital converter for low power CMOS. It requires 2-1 comparators, an encoder to convert thermometer code to binary code. The design is simulated in cadence environment us...

We present an algorithmic analog-to-digital converter (ADC) architecture for large-scale parallel quantization of internally analog variables in externally digital array processors. The converter quantizes and accumulates a binary weighted sequence of partial binary-binary matrix-vector products computed on the analog array, under presentation of bit-serial inputs in descending binary order. Th...

This Paper introduced a 4 bit Flash Analog to Digital converter. The propose ADC consist of the comparators and the MUX based decoder. Propose Comparator eliminate the use of resistor ladder in the circuit. All the input of comparators are connected to the common input node. Depending upon the internal voltage of comparator and the input voltage output may be “0” or “1” known as thermometer cod...

Presenter: A. Zech ([email protected]), fra-zech-A-abs1-he14-poster We present studies of systematic uncertainties in the measurement of the ultra-high energy cosmic ray (UHECR) spectrum with the FADC detector of the High Resolution Fly's Eye experiment (HiRes-II). One source of uncertainties lies in the simulation of the energy dependent aperture of the air fluorescence detector. We study...

This application note explains various ADC (Analog to Digital Converter) characterization parameters given in the datasheets and how they effect ADC measurements. It also describes how to measure these parameters during application testing in production and how to perform run-time compensation for some of the measured deviations. A great advantage with the Flash memory of the Atmel AVR is that ...

the read channel of optical and magnetic data storage systems. The required resolution is about 6-7 bits while the sampling rate and effective resolution bandwidth requirements with each generation of storage system. Folding is a technique to reduce the increase number of comparators used in the flash architecture. By means of an analog preprocessing circuit in folding A/D converters the number...