Identifiability of sensor gain faults is studied and a novel approach to fault detection and diagnosis of a class of nonlinear systems is presented. Sensor gain faults are divided into two classes: the conditionally identifiable faults and the conditionally detectable faults. An algorithm is proposed to obtain the number and location of the conditionally identifiable faults. Asymptotic estimati...

This paper studies single-fault fault collapsing in sequential logic circuits. Two major phenomena, self-hiding (SH) and delayed reconvergence (DR), which arise from the existence of feedback paths and storage elements in sequential circuits, are analyzed and found to cause the dominance relationship which is valid in combinational circuits but no longer valid in sequential circuits. A fault-co...

common use is the distinction into two (abstract) fault models: A new fault modelling scheme for integrated analogue general the "Single Hard Fault Model (SHFM)" and the CMOS circuits referred to as Local Layout Realistic Fault Mapping is introduced. It is aimed at realistic fault 1 assumptions prior to the final layout by investigating typical “local” layout structures of analogue designs. Spe...

By simulating a multi-terminal high voltage DC grid using a detailed electro-magnetic transient simulation model, challenges in fault detection and discrimination are demonstrated. To select the most appropriate signal for fast and reliable detection of faults, behavior of the DC grid during the faults is observed by means of various terminal measurements. By simulating different scenarios, cha...

the most enigmatic problems with the nearly 200 salt domes pierced in the persian gulf and in the zagros mountain ranges (zmr) in southern iran, a unique morphology in the world, have been the matter of this study, which is based on a combination of field work, enhancement of satellite and aerial photographs etc. in the zmr, structural anomalies are frequently associated with similar facies dis...

Memory testing commonly faces two issues: the characterization of detailed and realistic fault models, and the definition of time-efficient test algorithms able to detect them. Among the different types of algorithms proposed for testing Static Random Access Memories (SRAMs), march tests have proven to be faster, simpler and regularly structured. The continuous evolution of the memory technolog...

Since Field programmable gate arrays (FPGAs) are reprogrammable, faults in them can be easily toleruted once fault sites are located. Previous researches on diagnosis of FPGAs mainly deal with faulty logic block. In this paper we present a method for the testing and diagnosis of faults in the interconnect structures of FPGAs. A predefined set of tests that can locate all single faults and many ...

Classical single stuck-at faults are analyzed as surrogates for any non-classical fault that may have caused an observed failure. Although multiple stuck-at faults are used as an illustrative example of non-classical faults, proposed algorithms are applicable to any other type of fault. Our effect-cause analysis is less complex than existing methods. The diagnostic procedure adds or removes fau...

We address delay faults: faults that cause a software component to take more time for completing an action than a given deadline. Such faults are particularly of interest in realtime mission-critical control applications that use general-purpose computing platforms to compute setpoints. A violation of realtime constraints associated with setpoints can result in failure. Existing benign and Byza...

The problem of fault detection and isolation of parametric faults is considered in this paper. A fault detection problem based on parametric faults are associated with internal parameter variations in the dynamical system. A fault detection and isolation method for parametric faults is formulated in a standard setup and a synthesis method for the fault detector is given. Further, fault detectio...