Off-peak backgrounds Typically background is characterized in EPMA by measuring the x-ray intensities on either side of the analytical peak and interpolating the value underneath the x-ray peak. This interpolated intensity is then subtracted from the peak intensity to produce a background corrected net intensity for the element in question. Care must be taken to avoid interferences with the off...

The hydride distribution in a cracked Zircaloy cladding tube has been investigated by neutron radiography, Scanning Electron Microscopy (SEM) and Hydrogen measurements. The crack occurred during handling in the spent fuel pool. Back Scattered Electron images showed some unexpected contrasts in zones with high hydrogen concentrations near cracks. This phase has been studied by SEM and EPMA. Afte...

Pigmentation of the oral mucosa is relatively common and has a wide variety of etiologies. Although most pigmented lesions of the oral mucosa are associated with deposition of melanin and accidental displacement of a dental alloy, accurate differential diagnosis of a pigmented lesion is important, especially in the case of malignant melanoma. We report two cases of oral mucosal pigmentation ass...

Electron probe microanalysis (EPMA) is based on the comparison of characteristic intensities induced by monoenergetic electrons. When the electron beam ionizes inner atomic shells and these ionizations cause the emission of characteristic X-rays, secondary fluorescence can occur, originating from ionizations induced by X-ray photons produced by the primary electron interactions. As detectors ar...