Leakage current measurements can be used to determine the aging condition of ZnO arrester. The leakage that occurs in arrester is divided into two, namely external and internal currents. affected by contamination varistor currents are measured separately their contribution condition. In this study, effect salt on was studied further. level consisted low, medium heavy. obtained analyzed using wa...

Silicon carbide (SiC) MOSFETs have lower loss, faster switching and better thermal conductivity compared to silicon MOSFETs; however, their reliability remains a major concern hindering widespread adoption. In-situ, low-cost condition monitoring of the devices within power converter can alleviate this concern. Gate-leakage current has been shown be one most consistent failure precursors degrade...