نتایج جستجو برای: automatic inspection

تعداد نتایج: 171655  

2011
Chih-Wei Chen Chiou-Shann Fuh

We present a novel inspection framework to detect dirt and blemish in production line of optical fabrication automatically. To detect dirt defect from vignette surface, we use B-Spline to generate an ideal vignette surface and subtract the contaminated surface from the generated vignette surface to locate the defect. Besides, we apply some image processing methods to optimize our inspection fra...

2001
Chao-Ton Su Taho Yang

Semiconductor wafer post-sawing requires full inspection to assure defect-free outgoing dies. A defect problem is usually identified through visual judgment by the aid of a scanning electron microscope. By this means, potential misjudgment may be introduced into the inspection process due to human fatigue. In addition, the full inspection process can incur significant personnel costs. This rese...

Journal: :Computer Vision and Image Understanding 1996
Madhav Moganti Fikret Erçal Cihan H. Dagli Shou Tsunekawa

1 abstract The importance of the inspection process has been magniied by the requirements of the modern manufacturing environment. In electronics mass-production manufacturing facilities, an attempt is often made to achieve 100 % quality assurance of all parts, subassemblies, and nished goods. A variety of approaches for automated visual inspection of printed circuits have been reported over th...

Journal: :Remote Sensing 2017
Yong Zhang Xiuxiao Yuan Wenzhuo Li Shiyu Chen

Power line inspection ensures the safe operation of a power transmission grid. Using unmanned aerial vehicle (UAV) images of power line corridors is an effective way to carry out these vital inspections. In this paper, we propose an automatic inspection method for power lines using UAV images. This method, known as the power line automatic measurement method based on epipolar constraints (PLAME...

2005
Byoung-Wook Choi Kuk Won Ko Kyoung-Chul Koh Bok Shin Ahn

This paper presents a development of automatic complementary metal-oxidesemiconductor (CMOS) camera inspection system to examine defects. The image capture board based on embedded linux using system-on-a-chip (SoC) and a complex programmable logic device (CPLD) is developed to capture CMOS sensor data. The captured sensor data is transferred to the host computer through TCP/IP socket communicat...

Journal: :Advances in transdisciplinary engineering 2022

Automatic piloting of unmanned aerial vehicles(UAVs) is vital for the safety UAVs and optical image quality acquired by them. In previous effort, automatic pilot method based on or GPS (global position system). Inspired bird migration using terrestrial magnetic field, a novel autopilot field sensing above 10 kV OHLs (overhead lines) proposed in this paper to achieve routine inspection. The resu...

1997
Robert Sablatnig

This work aims to show a systematic automated visual inspection concept that speeds up the development of such systems by providing a software reuse and setup concept. A new, highly adaptable concept for visual inspection separates the detection of primitives from the modelbased analysis process. This separation is reached by defining a general analysis graph for inspection, containing detail r...

2017
Yair Wiseman

The monitoring of the SkyTran track condition is imperative. Damaged tracks can cause a fatal crash that can even claim lives. A mechanism for an automatic persistent inspection of SkyTran track system is suggested. The paper suggests employing basic digital camera that can produce JPEG images for this task. If a damage track segment is detected, the traffic in this segment should be halted imm...

Journal: :Pattern Recognition 2001
Du-Ming Tsai Bo Hsiao

In automatic surface inspection, one has to solve the problem of detecting small surface defects which locally break the homogeneity of a texture pattern. Textures are generally classified into two major types, structural and statistical [1]. Structural textures are those that are composed of repetitions of some basic texture primitive, such as directional lines, with a deterministic rule of di...

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