نتایج جستجو برای: atomic force microscopy thermal properties

تعداد نتایج: 1413518  

Journal: :Journal of Physics: Condensed Matter 2017

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Journal: :Beilstein Journal of Nanotechnology 2012

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Journal: :Review of Scientific Instruments 2013

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2009
Yang Gan

editor: W.H. Weinberg Dedicated to Professor Wuyang Chu (USTB) on the occasion of his 70th birthday

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2016
Giovanni Longo Sandor Kasas Simone Dinarelli Marco Girasole

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2017
Kenichiro Koga Xiao Cheng Zeng X. C. Zeng

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2013
Sergio Santos Victor Barcons Hugo K. Christenson Daniel J. Billingsley William A. Bonass Josep Font Neil H. Thomson

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2017
Naveen Kumar Zhengdao Wang Nicola Elia Krishna Rajan

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Journal: :The Review of scientific instruments 2010
Brian D Iverson John E Blendell Suresh V Garimella

Thermal diffusion measurements on polymethylmethacrylate-coated Si substrates using heated atomic force microscopy tips were performed to determine the contact resistance between an organic thin film and Si. The measurement methodology presented demonstrates how the thermal contrast signal obtained during a force-displacement ramp is used to quantify the resistance to heat transfer through an i...

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Journal: :Nature 2021

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