In this paper we present a novel approach for patternconstrained test case generation. The generation of test cases with known characteristics is usually a non-trivial task. In contrast, the proposed method allows for a transparent and intuitive modeling of the relations contained in the test data. For the presented approach, we utilize a general-purpose data generator: It relies on easy to und...

A k-bounded recognizable pattern language is the set of all k-bounded patterns that are obtained as behaviors of a pattern automaton. The emptiness and the equality problems for k-bounded behaviors of pattern automata are proved to be decidable. Moreover, we examine their relationship with context free pattern grammars, which are basically the hyperedge replacement grammars on planar directed a...

This paper extends state-of-the-art ATPG systems by including constraints, called restrictors, on the allowable values of the bits of a test vector. Such restrictors often occur in ’realworld’ circuits where certain bit positions of a test vector have to take on a particular value (e.g. in case of a reset line) or are prohibited from taking on a particular value (e.g. in order to prevent an ill...