Results of analysis of XRCF ACIS pileup tests H-IAI-CR-1.001, 1.003 and 1.005 are presented. In this series of tests with monotically increasing Al Kα source flux (ranging from ∼ 0.3 to ∼ 3.0 ACIS counts/frame in the absence of pileup) incident on a frontside-illuminated CCD, various symptoms of pileup — image degradation, grade migration, count rate non-linearity, and event pulse height confus...