Due to aggressive scaling down, multiple-node-upset hardened design has become a major concern regarding radiation hardening. The proposed latch overcomes the architecture and performance limitations of state-of-the-art double-node-upset (DNU)-resilient latches. A novel stacked element is developed with multiple thresholds, regular architecture, increased number single-event upset (SEU)-insensi...

With the reduction of technology nodes now reaching 2 nm, circuits become increasingly susceptible to external perturbations. Thereby, soft errors, such as single-node-upset (SNU), single-event-transient (SET), double-node-upset (DNU), and even triple-node-upset (TNU), must be considered for safety-critical applications. This article first presents four advanced circuit components (i.e., voters...

FPGA has found an increasingly wide utilization in automatic train control (ATC) equipment used in highspeed rail systems, which is potentially sensitive to radiation. How the space radiation caused by Geomagnetic storm affects FPGA devices was analyzed. This paper investigated the FPGA fault-tolerant techniques used nowadays and presented a new mitigation technique based on duplication with co...