نتایج جستجو برای: thickness monitor

تعداد نتایج: 188155  

2011
C. Laverde

Corrosion in process industries is becoming bigger issue day by day and is also the most common cause of asset failure / forced shutdown in plants. Failure of a pipeline or vessel can be dangerous & costly and have severe environmental consequences. A typical mode of asset failure is wall thinning to a critical thickness due to erosion or internal & external corrosion. To keep track of corrosio...

2016
Kevin Jourde Dominique Gibert Jacques Marteau Jean de Bremond d’Ars Serge Gardien Claude Girerd Jean-Christophe Ianigro

Usage of secondary cosmic muons to image the geological structures density distribution significantly developed during the past ten years. Recent applications demonstrate the method interest to monitor magma ascent and volcanic gas movements inside volcanoes. Muon radiography could be used to monitor density variations in aquifers and the critical zone in the near surface. However, the time res...

2006
Norikazu Iwamura Kazuo Misue Jiro Tanaka

We propose a system that enables users to write memos directly on a computer screen by hand. The system helps users save the screen images along with a user's handwritten strokes and in searching for them. We describe some of the important functions of the system and the effective retrieval keys for searching for saved images. We explain that the implementation of our prototype system consists ...

Journal: :journal of current ophthalmology 0
رعنا سرخابی rana sorkhabi محمدباقر رهبانی mohamad bagher rahbani محمدحسین آهور mohamad hosein ahoor وحیده منوچهری vahide manoochehri

purpose : to evaluate the retinal nerve fiber layer (rnfl) and central corneal thickness (cct) in patients with exfoliation syndrome (xfs) methods : in this comparative case series we measures rnfl thickness and cct 30 patients with xfs and 30 age and sex matched healthy subjects who met the inclusion criteria. results : average rnfl in xfs group were significantly thinner than controls (94.36±...

Journal: :journal of current ophthalmology 0
محمدعلی زارع مهرجردی mohammad ali zare قاسم فخرایی ghasem fakhraie فهیمه اسدی آملی fahimeh asadi amoli علی عبداللهی ali abdollahi هادی زارع مهرجردی hadi z-mehrjardi

purpose : to compare central corneal thickness (cct), corneal endothelial cell density, and lens capsule thickness in normotensive patients with and without pseudoexfoliation syndrome (pxs) methods : this was a prospective, comparative, descriptive study. normotensive candidates for cataract surgery with (study group) and without (control group) pxs were enrolled in the study. cct and corneal e...

2015
Takashi Naito Toshiyuki Mitsuhashi

Due to its good spatial resolution, the YAG:Ce screen monitor is often used for small beam profile measurement in the Linac and beam transport line. We constructed a high-resolution YAG:Ce screen monitor at KEK-ATF2 for the observation of small size beam. We tested two types of screen, one is ceramic (sintered alumina powder) YAG:Ce and the other is single crystal YAG:Ce. Both screens have 50μm...

Journal: :Annual review of physical chemistry 1998
W Knoll

This contribution summarizes the use of plasmon surface polaritons and guided optical waves for the characterization of interfaces and thin organic films. After a short introduction to the theoretical background of evanescent wave optics, examples are given that show how this interfacial "light" can be employed to monitor thin coatings at a solid/air or solid/liquid interface. Examples are give...

2012
Toshihide TSURU Takashi TSUTOU Tadashi HATANO Masaki YAMAMOTO

Instrumentation To overcome current difficulty of absolute period control in the EUV multilayer fabrication by sputtering, we have developed an automatic null ellipsometer as a sputtering rate monitor having high enough picometer thickness sensitivity enabling accurate monitoring of the nm period multilayer fabrication [1]. Figure 1 shows schematic drawing of the ellipsometer installed as the s...

2009
K. T. McDonald Josepll Henry

A beam-profile monitor has been designed to diagnose the 5-MeV high-brightness electron beam from the rf gun of the BNL Accelerator Test Facility ‘(ATF). The monitor consists of a phosphor screen viewed by a CCD camera. The video images are digitized and stored by a framegrabber and analyzed by an IBM PC-AT to extract the emittance. Details of the hardware configuration are presented, along wit...

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