A new general reflectance model for computer graphics is presented.The model is based on physical optics and describes specular, di-rectional diffuse, and uniform diffuse reflection by a surface. Thereflected light pattern depends on wavelength, incidence angle, twosurface roughness parameters. and surface refractive index. The for-mulation is self consistent in terms of...

An antireflection overcoat for opaque baffle coatings in the FIRlsubmillimeter region has been made from a simple Teflon spray-on lubJricant. The Teflon overcoat reduced the specular reflectance of four different c,paque coatings by nearly a factor of two. Analysis, based on the interfElrence term of a reflecting-layer model, indicates that in the submillimeter region the reduced reflectance de...

The photometric sampling method extracts shape and reflectance properties of surfaces by using multiple illumination directions and a single viewing direction. We have previously proposed a recovering algorithm for smooth surfaces. One of the limitations of the previous algorithm is that it cannot recover the shape and roughness of specular lobe dominant surfaces. Surface reflection consists of...

We demonstrate an approach for producing an array of nanopores on a silicon surface. The methods used combine nonlithographic pattern transfer and chlorine plasma etching to produce ,60 nm diam holes up to 1 mm in depth. The near-normal specular optical reflectance of these systematically modified surfaces is found to decrease dramatically with pore depth across the entire 2.0–6.0 eV photon ene...

In this paper, we propose a new reflectance separation model to separate the diffuse and specular reflection components. The model is based on a two-dimensional space called Ch-CV space, which is spanned by maximum chromaticity and the coefficient of variation (CV) of RGB color. The space exhibits a more direct correspondence to diffuse and specular reflection components than the RGB color spac...

The reflectance of a surface usually depends on the angles, at which the surface is illuminated and viewed. The dependence can be described by the Bidirectional Reflectance Distribution Function BRDF. In this study, the BRDFs of several samples typically found in urban areas (roof tiles, asphalt, etc.) were measured at the European Goniometric Facility EGO in Ispra, Italy with hyperspectral sen...

We present a novel acquisition device to capture high resolution 4D reflectance fields of real scenes. The device consists of a concave hemispherical surface coated with a rough specular paint and a digital video projector with a fish-eye lens positioned near the center of the hemisphere. The scene is placed near the projector, also near the center, and photographed from a fixed vantage point. ...

To appropriately reproduce a real object in a mixed environment, it is necessary to estimate reflectance properties of object surfaces. This paper describes a new method of densely estimating non-uniform surface reflectance properties of an object with convex and concave surfaces using registered range and surface color texture images obtained by a laser rangefinder. The proposed method determi...

We show that highlights in images of objects with specularly reflecting surfaces provide significant information about the surfaces which generate them. A brief survey is given of specular reflectance models which have been used in computer vision and graphics. For our work, we adopt the Torrance-Sparrow specular model which, unlike most previous models, considers the underlying physics of spec...

Porous silicon samples were prepared by electrochemical etching method for different etching times. The structural properties of porous silicon (PS) samples were determined from the Atomic Force Microscopy (AFM) measurements. The surface mean root square roughness (σ rms) changes as function of porosity were studied, and the influence of etching time on porosity and roughness was studied too. U...