نتایج جستجو برای: semiconductor metal boundary

تعداد نتایج: 405674  

Journal: :Proceedings of the National Academy of Sciences of the United States of America 2006
Alfredo A Correa Stanimir A Bonev Giulia Galli

At high pressure and temperature, the phase diagram of elemental carbon is poorly known. We present predictions of diamond and BC8 melting lines and their phase boundary in the solid phase, as obtained from first-principles calculations. Maxima are found in both melting lines, with a triple point located at approximately 850 GPa and approximately 7,400 K. Our results show that hot, compressed d...

2011
Sukru Burc Eryilmaz Ali K. Okyay

We computationally show that metallic nanoslitsintegrated on Germanium metalsemiconductor-metal photodetectors show absorption enhancement up to 8 for TM-polarization in the communications C-band due to interference of horizontal surface plasmons. OCIS codes: 040.5160; 130.0250; 250.5403 Semiconductor industry has continuously scaled down electronic devices, significantly improving device leve...

1997
L. L. Bonilla I. R. Cantalapiedra

A general asymptotic analysis of the Gunn effect in n-type GaAs under general boundary conditions for metal-semiconductor contacts is presented. Depending on the parameter values in the boundary condition of the injecting contact, different types of waves mediate the Gunn effect. The periodic current oscillation typical of the Gunn effect may be caused by moving charge-monopole accumulation or ...

2013
Andreas G. Andreou

The Field Effect Transistor (FET) is today the basic element of Very Large ScaIe Integrated (VLSI) digital systems. FETs are also used in analog circuits for high frequency (microwave) applications. Different types of FETs are the Metal Oxide Semiconductor Field Effect Transistors (MOSFETs), the MEtal Semiconductor Field Effect Transistors (MESFETs) and the MOdulation Doped Field Effect Transis...

2010
Chongqi Yu Hui Wang

The lateral photovoltaic effect (LPE) can be used in position-sensitive detectors to detect very small displacements due to its output of lateral photovoltage changing linearly with light spot position. In this review, we will summarize some of our recent works regarding LPE in metal-semiconductor and metal-oxide-semiconductor structures, and give a theoretical model of LPE in these two structu...

Journal: :Uspehi Fiziki Metallov 2004

پایان نامه :وزارت علوم، تحقیقات و فناوری - دانشگاه تربیت معلم تهران - دانشکده علوم 1379

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