نتایج جستجو برای: reflection spectroscopy

تعداد نتایج: 229710  

2013
Xiaofan Wang Seung Yeon Lee Kathryn Miller Rebecca Welbourn Isabella Stocker Stuart Clarke Michael Casford Philipp Gutfreund Maximilian W. A. Skoda

The binding of an anionic surfactant onto an anionic surface by addition of divalent ions is reported based on experimental data from specular neutron reflection (NR) and attenuated total internal reflection IR spectroscopy (ATR-IR). Similar measurements using monovalent ions (sodium) do not show any evidence of such adsorption, even though the amount of surfactant can be much higher. This data...

1998
Tae-In Jeon

We present reflection THz-time domain spectroscopy measurements of the complex conductivity of n-type, 0.038 V cm GaAs and n-type, 0.22 V cm Si wafers. These measurements clearly demonstrate the efficacy of the reflection technique on highly conductive, optically dense samples and approach the precision of THz–TDS transmission measurements. Because the THz-bandwidth, reflection measurements ext...

Journal: :Journal of biomedical optics 2013
Kun Chen Yanmei Liang Yuan Zhang

Optical clearing agents can improve tissue optical transmittance by reducing the diffuse reflection. The reflection on in vivo human skin before and after applying anhydrous glycerol and 30 to 50% liquid paraffin glycerol mixed solution are investigated in this paper. From their visible and near-infrared reflection spectroscopy, all of their diffuse reflections are reduced after applying the ag...

2001
S. Nashima O. Morikawa K. Takata M. Hangyo

Optical properties of doped silicon wafers have been measured by means of terahertz time domain reflection spectroscopy. A method is proposed to obtain the relative phase by reflection accurately. By using this method, the relative phase is obtained within an error of less than 10 mrad at 1 THz. The experimentally obtained complex conductivity of relatively high-doped silicon (r 50.136 V cm) in...

Journal: :Journal of biomedical optics 2017
Xu U Zhang Anouk L Post Dirk J Faber Ton G van Leeuwen Henricus J C M Sterenborg

To accurately determine sample optical properties using single fiber reflectance spectroscopy (SFR), an absolute calibration of the reflectance is required. We investigated two SFR calibration methods, using a calibrated mirror and using the Fresnel reflection at the fiber tip as a reference. We compared these to commonly used calibration methods, using either Intralipid-20% in combination with...

Journal: :IEEE Transactions on Terahertz Science and Technology 2012

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