نتایج جستجو برای: parametric devices

تعداد نتایج: 260649  

2007
Ryo Ohtera Takahiko Horiuchi Shoji Tominaga

In the coming ubiquitous-computing society, an eyegaze interface will be one of the key technologies as an input device. Most of the conventional eyegaze tracking algorithms require specific light sources, equipments, devices, etc. In a previous work, the authors developed a simple eye-gaze detection system using a monocular video camera. This paper proposes a fast eye-gaze detection algorithm ...

2018
Xiaoqin Shen Rigoberto Castro Beltran Vinh M Diep Soheil Soltani Andrea M Armani

Coherent frequency generators are an enabling platform in basic science and applied technology. Originally reliant on high-power lasers, recently comb generation has been demonstrated in ultrahigh-Q microcavities. The large circulating intensity within the cavity results in strong light-matter interaction, giving rise to Kerr parametric oscillations for comb generation. However, the comb genera...

2017
K. J. A. Ooi D. K. T. Ng T. Wang A. K. L. Chee S. K. Ng Q. Wang L. K. Ang A. M. Agarwal L. C. Kimerling D. T. H. Tan

CMOS platforms operating at the telecommunications wavelength either reside within the highly dissipative two-photon regime in silicon-based optical devices, or possess small nonlinearities. Bandgap engineering of non-stoichiometric silicon nitride using state-of-the-art fabrication techniques has led to our development of USRN (ultra-silicon-rich nitride) in the form of Si7N3, that possesses a...

2014
Helmut Seidl Thomas Gawlitza Martin D. Schwarz

Program behavior may depend on parameters, which are either configured before compilation time, or provided at runtime, e.g., by sensors or other input devices. Parametric program analysis explores how different parameter settings may affect the program behavior. In order to infer invariants depending on parameters, we introduce parametric strategy iteration. This algorithm determines the preci...

Journal: :Physical review letters 2005
S S R Oemrawsingh X Ma D Voigt A Aiello E R Eliel G W 't Hooft J P Woerdman

The singular nature of a noninteger spiral phase plate allows easy manipulation of spatial degrees of freedom of photon states. Using two such devices, we have observed very high-dimensional spatial entanglement of twin photons generated by spontaneous parametric down-conversion.

2009
M. Santagiustina L. Schenato C. G. Someda

Efficient slow and fast light fiber devices based on narrow band optical parametric amplification require a strict polarization control of the waves involved in the interaction. The use of high birefringence and spun fibers is studied theoretically, possible impairments evaluated, and design parameters determined.

2003
I. S. Stievano

This paper addresses the selection of parametric relations for the macromodeling of the output and power supply ports of IC output buffers. Relations defined by sigmoidal functions and parameter estimation via fully nonlinear optimization algorithms can lead to models with improved efficiency. Modeling examples involving commercial devices are shown.

2001
Martin Muñoz Navin B. Patel

In this work, we show that the use of a wafer-bonding technique, wherein an inverted half-waveguide structure is bonded on the upright half to form a complete waveguide, optimizes the overlap factor present in three-wave parametric interactions realized in 43 semiconductor waveguides. These optimized waveguides can be used for efficient frequency-mixing devices which detect or emit infrared light.

Journal: :Physical review. A, Atomic, molecular, and optical physics 1992
Cabrillo Bermejo Garcia-Fernandez Toral Colet San Miguel M

The dynamical properties of an optical parametric amplifier with an added fourth-order (Kerreffect term) nonlinearity are studied by means of a computer simulation of a semiclassical nonlinear Langevin formulation. The transient statistics above threshold are analyzed in detail, and the relevance of the present results for the production of squeezed light in traveling-wave devices is finally di...

2017
Author

An alternative method to fixed quality acceptance limits for in-line yield control is proposed. Our study is based on a sensitivity analysis, which has revealed that conventional parametric yield-control techniques using fixed in-line acceptance (tolerance) limits, as traditionally used in semiconductor manufacturing, are not efficient in deep submicron-size devices.

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