نتایج جستجو برای: nanoscale beam
تعداد نتایج: 135855 فیلتر نتایج به سال:
Nitrogen vacancy (NV) color centers in diamond are a leading modality for both superresolution optical imaging and nanoscale magnetic field sensing. In this work, we address the key challenge of performing optical magnetic imaging and spectroscopy selectively on multiple NV centers that are located within a diffraction-limited field-of-view. We use spin-RESOLFT microscopy to enable precision na...
Nanoscale dispensing (NADIS) has been recently developed for liquid deposition and manipulation. In NADIS, atomic force microscope probe milled by a focused ion beam was used for nanoscale dispensing of liquid. We present an approach to control the size of dispensed droplets by several parameters such as the aperture size on the probe, the surface energy of both tip outer wall and sample surfac...
We demonstrate the growth of defect-free zinc-blende GaAs nanomembranes by molecular beam epitaxy. Our growth studies indicate a strong impact of As4 re-emission and shadowing in the growth rate of the structures. The highest aspect ratio structures are obtained for pitches around 0.7-1 μm and a gallium rate of 1 Å s(-1). The functionality of the membranes is further illustrated by the growth o...
In this Review article, we highlighted current trends in shrinking the channel length of organic field effect transistors (OFETs) down to the nanoscale in three systems where sophisticated device fabrication has been integrated into the development of different electrodes with nanoscale gaps. The design principle is the combination of molecular design freedom and flexible molecular self-assembl...
Coherent atomic motions in materials can be revealed using time-resolved X-ray and electron Bragg diffraction. Because of the size of the beam used, typically on the micron scale, the detection of nanoscale propagating waves in extended structures hitherto has not been reported. For elastic waves of complex motions, Bragg intensities contain all polarizations and they are not straightforward to...
Soft lithography was used to replicate nanoscale features made using electron beam lithography on a polymethylmethacrylate (PMMA) master. The PMMA masters were exposed to fluorinated silane vapors to passivate its surfaces so that polydimethylsiloxane (PDMS) did not permanently bond to the master. From scanning electron microscopy, the silanization process was found to deposit a coating on the ...
Silk protein fibres produced by silkworms and spiders are renowned for their unparalleled mechanical strength and extensibility arising from their high-β-sheet crystal contents as natural materials. Investigation of β-sheet-oriented conformational transitions in silk proteins at the nanoscale remains a challenge using conventional imaging techniques given their limitations in chemical sensitivi...
A Comparative Study of Electrical Transport Phenomena in Ultrathin vs. Nanoscale SOI MOSFETs Devices
Ultrathin (UTD) and Nanoscale (NSD) SOI-MOSFET devices, sharing a similar W/L but with a channel thickness of 46nm and 1.6nm respectively, were fabricated using a selective “gate recessed” process on the same silicon wafer. The electrical transport characterization at room temperature has shown a large difference between the two kinds of devices and has been interpreted in terms of a huge unexp...
the behavior of nanoscale energetic materials is quite different from micronsized energetic materials inmany ways. recently, some techniques such as sol-gel method, high speed air impaction and vacuum codeposition have been employed to obtain nanoscale energetic materials. however, only few attentionswere paid to nanoscale energetic materials because of the fabrication difficulty. in this paper...
Motif parameters based characterization of line edge roughness(LER) of a nanoscale grating structure
Motif parameters were introduced to characterize LER of a nanoscale grating structure. Firstly with electron beam lithography employed the expected nano-scale grating structure with linewidth 16nm was fabricated on positive resist. Then the line edge profiles of the structure were extracted and their LER was characterized. The results showed aforementioned evaluation method is rather simple, ef...
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