While metrology has a long tradition of use in physics and chemistry, it is rarely referred to in the software engineering measurement, and in particular, in the design and documentation of software measures. Using the ISO 9126-4 Technical Report on the measurement of software quality in use as a case study, this paper reports on the extent to which this ISO series addresses the metrology crite...

Three-dimensional integrated circuits (3D ICs) introduce wafer bonding and Through Silicon Vias (TSVs) as new modules, thus extending manufacturing requirements beyond CMOS. A 3D IC with a photosensor is taken as an example to further analyze the resulting new metrology requirements for mass production. For the wafer bond module, data on defects before and after bonding, bond interface adhesion...

Since 2020 a large consortium has been engaged in the project EMPIR 19ENV01 traceRadon to develop missing traceability chains improve sensor networks climate observation and radiation protection. This paper presents results areas of: Novel 226Ra standard sources with continuous controlled 222Rn emanation rate, radon chambers aimed create reference atmosphere field for flux monitoring. The major...

Modern industry needs quick and reliable measurement methods for measuring deformation, position, shape, roughness, etc. This thesis is mainly concerned with industrial applications of speckle metrology. Speckle metrology is an optical non-contact whole field technique that provides the means to measure; deformation and displacement, object shape, surface roughness, vibration, and dynamic event...

We report on advances in ac voltage metrology made possible by a new generation of Multijunction Thermal Converters (MJTCs). Although intended for use primarily in highfrequency (1 MHz to 100 MHz) metrology, their exceptional low-frequency qualities, combined with a large dynamic range, makes these MJTCs excellent devices for the frequency range 10 Hz to 100 MHz at voltages from 1 V to 20 V, de...

We describe nonlinear quantum atom–light interfaces and nonlinear quantum metrology in the collective continuous variable formalism. We develop a nonlinear effective Hamiltonian in terms of spin and polarization collective variables and show that model Hamiltonians of interest for nonlinear quantum metrology can be produced in 87Rb ensembles. With these Hamiltonians, metrologically relevant ato...

In a previous paper, the University of Arizona (UA) has developed a measurement technique called: Software Configurable Optical Test System (SCOTS) based on the principle of reflection deflectometry. In this paper, we present results of this very efficient optical metrology method applied to the metrology of X-ray mirrors. We used this technique to measure surface slope errors with precision an...

Uniform sampling in metrology has known drawbacks such as coherent spectral aliasing and a lack of efficiency in terms of measuring time and data storage. The requirement for intelligent sampling strategies has been outlined over recent years, particularly where the measurement of structured surfaces is concerned. Most of the present research on intelligent sampling has focused on dimensional m...

A novel cable-based metrology system is presented wherein six cables are connected in parallel from ground-mounted string pots to the moving object or tool of interest. Cartesian pose can be determined for feedback control and other purposes by reading the lengths of the six cables via the string pots and using closed-form forward pose kinematics. This article focuses on a sculpting metrology t...

Quantum states of light, such as squeezed states or entangled states, can be used to make measurements (metrology), produce images, and sense objects with a precision that far exceeds what is possible classically, and also exceeds what was once thought to be possible quantum mechanically. The primary idea is to exploit quantum effects to beat the shot-noise limit in metrology and the Rayleigh d...