The progress on the focused ion beam fabrication method provides us several kinds of advanced techniques for the sample preparation of transmission electron microscopy. With improvement of the beam convergence and the increase of the ion accelerating voltage, the ability of its scanning ion microscope becomes glade up with a good image resolution. The scanning ion microscope is now powerful too...

Organometal halide perovskites show promising features for cost-effective application in photovoltaics. The material instability remains a major obstacle to broad application because of the poorly understood degradation pathways. Here, we apply simultaneous luminescence and electron microscopy on perovskites for the first time, allowing us to monitor in situ morphology evolution and optical pro...