Although integral and differential nonlinearity may not be the most important parameters for highspeed, high dynamic performance data converters, they gain significance when it comes to high-resolution imaging applications. The following application note serves as a refresher course for their definitions and details two different, yet commonly used techniques to measure INL and DNL in high-spee...

A 10-bit 120MS/s successive-approximation-register (SAR) analog-to-digital converter (ADC) in 40-nm CMOS is presented. To diminish the fluctuation of common-mode voltage (VCM) and switching energy during conversion, a VCM-stable scheme adopted without increasing design complexity to VCM buffers. Moreover, tri-switch sampling employed this design. Together with binary-scaled recombination weight...

Abstract. The number of sensors used in modern devices is rapidly increasing, and the interaction with demands analog-to-digital data conversion (ADC). A conventional ADC leading-edge technologies faces many issues due to signal swings, manufacturing deviations, noise, etc. Designers ADCs are moving time domain digital designs techniques deal these issues. This work pursues a novel self-adaptiv...

background: drug resistance is widely believed to be an increasingly serious threat to global public health. we have previously reported that short term exposure of microorganisms to diagnostic ultrasound waves could significantly alter their sensitivity to antibiotics. in our previous studies, klebsiella pneumoniae showed major differences in the sensitivity to antibiotics in exposed and non-e...

Accurate current measurement is crucial in many biosensing applications, such as the detection of neurotransmitters [1] and the monitoring of intercellular molecular dynamics. This need has become even more critical recently with single-molecule biosensors where sub-pA signal currents are superimposed on a slowly varying nA-to-μA background current, as is the case with nanopores [2]. As such, t...

Abstract Capacitor mismatch problem due to process variation causes weight error, which deteriorates the linearity of SAR ADC. In this paper, a novel calibration scheme based on genetic algorithm(GA) combined with radix‐less‐than‐2 ADC is proposed extract error caused by capacitor mismatch. This foreground and no extra injections are added. The GA‐based simulated 40 nm CMOS technology. After ca...

This research presents the review of Analog to Digital Convertor (ADC). For ADC there are mainly four different methods, Flash ADC, Pipelined ADC, Successive Approximation ADC, and Sigma Delta ADC. The Flash ADC is the Fast ADC. For Designing the ADC, the parameters important are Static and Dynamic. In static parameters Differential Non Linearity Error (DNLE), Integral Non Linearity Error (INLE...

Although integral and differential nonlinearity may not be the most important parameters for high-speed, high dynamic performance data converters, they gain significance when it comes to high-resolution imaging applications. The following application note serves as a refresher course for their definitions and details two different, yet commonly used techniques to measure INL and DNL in high-spe...

This special project presents a 10-Bit 1Gs/s 1.2V/3.3V Digital-to-Analog Converter using1 Poly 9 Metal SAED 90-nm CMOS Technology intended for mixed-signal and power IC applications. To achieve maximum performance with minimum area, the DAC has been implemented in 6+4 Segmentation. The simulation results show a static performance of ±0.56 LSB INL and ±0.79 LSB DNL with a total layout chip area ...

As the performance of Analog-to-Digital Converters continues to improve, it is becoming more challenging and costly to develop sufficiently fast and low-drift signal generators that are adequately more linear than the ADC for the purpose of linearity testing. This work relaxes the linearity requirements on the signal generators used for ADC testing by alternatively employing multiple non-linear...