نتایج جستجو برای: energy dispersive x rays edx

تعداد نتایج: 1254943  

2006
J. E. Alfonso J. Torres J. F. Marco

In this work, the influence of the substrate bias on the crystalline structure and surface composition of Ti6Al4V thin films prepared by rf magnetron sputtering were studied. Samples were grown onto two different types of substrates: AISI 420 steel and common glass using a Ti6Al4V (99.9 %) target. Substrate bias was varied from –100V to –200 V. Samples were characterized by X-ray diffraction (X...

2013
Mohammad Abul Hossain Shahidul Islam

Carbon nanoparticles (CNPs) were synthesized by a simple way of incomplete combustion of kerosene. Synthesized nanoparticles were characterized by Scanning electron microscope (SEM), Energy dispersive x-ray (EDX), Powder x-ray diffractometry (XRD) and Fourier transform infrared spectroscopy (FTIR). The SEM particle sizes of prepared CNPs were found to be non-uniform. The average size of particl...

Pirouz Derakhshi Roshanak Lotfi

Nanoparticles of nickel substituted cobalt ferrite (Nix Co1-xFe2 O4 : 0£ X£ 1) have been synthesized by co-precipitation method. Triton x-100 and oleic acid as surfactants were used. Particles size as estimated by the full width half maximum (FWHM) of the strongest X-ray diffraction (XRD) peak were found 17 and 21nm. Their morphology structure have been determined by scanning electron microscop...

2014

The SEM is especially useful when combined with Energy Dispersive X-ray spectroscopy (EDX), which can be performed in the microscope, enabling very small areas of the sample to be analyzed for their elemental composition. One disadvantage of the SEM approach is related to its high resolution. Only a very small area can be analyzed and the fracture pattern can rapidly become very complex to inte...

2017
Safdar Abbas Malik Le Thanh Hung Ngo Van Nong

The data presented in this article are related to the research article entitled: "Solder free joining as a highly effective method for making contact between thermoelectric materials and metallic electrodes" (Malik et al., 2017) [1]. This article presents microstructure obtained by scanning electron microscopy (SEM) and chemical analysis by energy dispersive X-ray spectroscopy (EDX) point measu...

2009
Volodymyr D. Khavryuchenko Oleksiy V. Khavryuchenko Andriy I. Shkilnyy Denys A. Stratiichuk Vladyslav V. Lisnyak

Amorphous Spherical Carbon with Nitrogen (SCN) active carbon has been prepared by carbonization of poly(vinylpyridine-divinylbenzene) (PVPDVB) copolymer. The PVPDVB dehydrogenation copolymer has been quantum chemically (QC) simulated using cluster and periodic models. Scanning electron microscopy (SEM), transmission electron microscopy (TEM) and energy dispersive X-ray (EDX) studies of the resu...

2015

Peats are geotechnically problematic soil due to their high compressibility and low shear strength. Cement is widely used for the stabilization of peat by deep mixing method (DMM). This paper presents the results of the model study of compressibility property of peats stabilized with cement columns formed by DMM. The results of consolidation test, scanning electron micrographs (SEM) and energy ...

2017
Adam J. Brooks Zhongwen Yao

The data presented in this article is related to the research experiment, titled: 'Quasi in-situ energy dispersive X-ray spectroscopy observation of matrix and solute interactions on Y-Ti-O oxide particles in an austenitic stainless steel under 1 MeV Kr2+ high temperature irradiation' (Brooks et al., 2017) [1]. Quasi in-situ analysis during 1 MeV Kr2+ 520 °C irradiation allowed the same microst...

2004
Chia Ying Lee Tseung Yuen Tseng Seu Yi Li Pang Lin

Single crystalline zinc oxide (ZnO) nanowires have been grown on Si (100) substrates by a vapor-liquid-solid (VLS) process at temperatures in the range 850-950 °C in an inert atmosphere. The VLS-grown ZnO nanowires have been characterized in detail using X-ray diffraction (XRD), field emission scanning electron microscopy (FESEM), X-ray photoelectron spectroscopy (XPS), transmission electron mi...

2002
J. Jasinski Z. Liliental-Weber S. Estrada

Transmission electron microscopy (TEM) and energy dispersive X-ray spectroscopy (EDX) studies of GaAs/GaN interfaces, obtained by direct wafer bonding, are presented. TEM observations show that most of the interface area was well bonded. A thin oxide layer, confirmed by EDX, was present at the interface in the well-bonded regions. Plan-view TEM studies showed the presence of two dislocation net...

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