نتایج جستجو برای: electron scanning microscopy sem
تعداد نتایج: 532423 فیلتر نتایج به سال:
The authors present scanning transmission electron microscopy STEM of carbon nanofibers CNFs on a bulk substrate using conventional scanning electron microscopy SEM without specimen thinning. By utilizing the electron beam tilted 85° from the substrate normal, bright-field STEM contrast is obtained for the CNFs on substrate with conventional SEM. Analysis of the observed contrast using Monte Ca...
National Institute of Standards and Technology, Gaithersburg, MD 20899-0001 During the manufacturing of presentday integrated circuits, certain measurements must be made of the submicrometer structures composing the device with a high degree of repeatability. Optical microscopy, scanning electron microscopy, and the various forms of scanning probe microscopies are major microscopical techniques...
Among the techniques of electron microscopy, scanning electron microscopy (SEM) represents a high-performance method of investigating structures and devices in the domain of nanometer dimensions. This paper is a synthesis of the possible applications of SEM in the investigation of the nanometer domain, nanomaterials and nanotechnologies. It includes the results of the authors’ research work as ...
the study describes the synthesis and characterization of zinc(ii) minoxidil nanocomposite (1). the reaction between zinc(ii) acetate, minoxidil, {c9h15n5o=minoxidil=(2,4-diamino-6-piperidine-1-yl) pyrimidine n-oxide)} as a ligand and ki as bridging agent, in methanol at 60°c leads to the formation of nano-sized zn(ii) minoxidil nanocomposite, 1. characterization of (1) was carried out by eleme...
A dual stage process of depositing bamboo-like carbon nanotubes (BCNTs) by hot filament chemical vapor deposition (HFCVD) and coating Si using Radio frequency sputtering (RFS) technique. The films were characterized by scanning electron microscopy (SEM), transmission electron microscopy (TEM), Raman spectroscopy, X-ray photoelectron spectroscopy (XPS), and electron field emission studies (EFE)....
The characterization of materials supports their development and in particular of superconductors, for their technological applications. Scanning electron microscopy (SEM) is one of these characterization techniques, whose data is used to estimate the properties, determine the shortcomings and hence improve the material. The phenomenon of superconductivity initially develops within the grain an...
in the present work, we report a suitable approach for the preparation of batio3 nanostructures via the hydrothermal condition using dolapix et85 as surfactant. the powders were investigated by x-ray diffraction (xrd), scanning election microscopy (sem), energy-dispersive x-ray spectroscopy (edax), field emission transmission electron microscopy (fetem), selected area electron diffraction (saed...
Cadmium oxide (CdO) nanoparticles have been prepared by chemical coprecipitation method. The synthesized nanoparticles were characterized by X-ray diffraction analysis (XRD), scanning electron microscopy (SEM), transmission electron microscopy (TEM), UV analysis, and dielectric studies. The crystalline nature and particle size of the CdO nanoparticles were characterized by Powder X-ray diffract...
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