Electron backscatter diffraction (EBSD) is based on the principle that a beam of electrons generated in the scanning electron microscope (SEM) is the source of randomly scattered electrons in a specimen. The backscattered electrons (BSE) that escape the sample generate a Kikuchi pattern on a phosphor screen, which is linked to the specimen crystal structure. Different crystal orientations gener...

Raman microspectroscopy provides the means to obtain local orientations on polycrystalline materials at the submicrometer level. The present work demonstrates how orientation-distribution maps composed of Raman intensity distributions can be acquired on large areas of several hundreds of square micrometers. A polycrystalline CuInSe2 thin film was used as a model system. The orientation distribu...

The locally varying tetragonality in martensite grains of a high‑carbon steel (1.2 mass percent C) was resolved by electron backscatter diffraction (EBSD) with spatial resolution the order 100 nm. Compared to spatially integrating X-ray diffraction, which yielded an average c/a = 1.05, EBSD measurements scanning microscope allowed image local variation lattice parameter ratio range 1.02 ≤ 1.07....

PbxBa1−xTiO3 (0.2 x 1) thin films were deposited on single-crystal MgO as well as amorphous Si3N4/Si substrates using biaxially textured MgO buffer templates, grown by ion beam-assisted deposition (IBAD). The ferroelectric films were stoichiometric and highly oriented, with only (001) and (100) orientations evident in x-ray diffraction (XRD) scans. Films on biaxially textured templates had smal...

Micro-scale laser shock peening LSP can potentially be applied to metallic structures in microdevices to improve fatigue and reliability performance. Copper thin films on a single-crystal silicon substrate are treated by using LSP and characterized using techniques of X-ray microdiffraction and electron backscatter diffraction (EBSD). Strain field, dislocation density, and microstructure change...

As expected from the alloy design procedure, combined Twinning Induced Plasticity (TWIP) and Transformation Induced Plasticity (TRIP) effects are activated in a metastable β Ti-12(wt.%)Mo alloy. In-situ Synchrotron X-ray diffraction (XRD), electron backscatter diffraction (EBSD) and transmission electron microscopy (TEM) observations were carried out to investigate the deformation mechanisms an...

In this study, the grain boundary character and texture of 50% and 90% cold-rolled FePd alloy was investigated during recrystallization at 700 °C. Electron backscatter diffraction (EBSD) measurements were performed on the rolling direction to normal direction section. Kernel average misorientation (KAM) calculated from EBSD measurements was employed to determine the recrystallization fraction. ...

The accuracy of electron backscatter diffraction (EBSD) and confocal Raman microscopy (CRM) for small-scale strain mapping are assessed using the multi-axial strain field surrounding a wedge indentation in Si as a test vehicle. The strain field is modeled using finite element analysis (FEA) that is adapted to the near-indentation surface profile measured by atomic force microscopy (AFM). The as...