Un-availability can be quantitatively defined as the ratio of MTTR (mean time to repair) to the sum of MTTR (mean time to repair) and MTTF (mean time to failure). Decreasing MTTR is as valuable as increasing MTTF. By learning why systems fail, failure distribution across parts of an IS, we attempt to envision a plausible model for future Information Technology (IT). In this endeavor, we focus o...

Probabilistic model based diagnosis com putes the posterior probabilities of failure of components from the prior probabilities of component failure and observations of sys tem behavior One problemwith this method is that such priors are almost never directly available One of the reasons is that the prior probability estimates include an implicit no tion of a time interval over which they are s...

This report introduces RAMP, an architectural model for long-term processor reliability measurement. With aggresive transistor scaling and increasing processor power and temperature, reliability due to wear-out mechanisms is expected to become a significant issue in microprocessor design. Reliability awareness at the microarchitectural design stage will soon be a neccessity and RAMP provides a ...

A safety instrumented system (SIS) may fail to operate as desired when one or more of its devices fail due to random, systematic, and common cause events. IEC 61511 (ANSI/ISA 84.00.01-2004) stresses the importance of minimizing the propagation of device failure into system failure through design, operating, inspection, and maintenance practices. To fully understand the lifecycle requirements, i...