nowadays, ii – iv group semiconductor thin films have attracted considerable attention from the research community because of their wide range of application in the fabrication of solar cells and other opto-electronic devices. cadmium zinc sulfide (zn-cds) thin films were grown by chemical bath deposition (cbd) technique. x-ray diffraction (xrd) is used to analyze the structure and crystallite ...

In this work, nanostructured CdO films with different coumarin contents in the growth solution were fabricated on glass substrates by the SILAR method. The effects of coumarin content in the bath on optical, structural and morphological properties were studied by means of (UV–vis) spectrophotometer, SEM and XRD analysis. The analysis showed that the band gaps, surface morphologies and XRD peak ...

Among the conducting polymers, Polyaniline and its derivatives have been studied extensively in the last decade with improvements in processing having the key role in establishing the intrinsic electrical properties. In the present paper, the camphor sulphonic acid [CSA] doped Poly (o-toluidine) [POT] was prepared using chemical oxidative polymerization method. The prepared CSA doped POT was ch...

Cadmium oxide (CdO) nanoparticles have been prepared by chemical coprecipitation method. The synthesized nanoparticles were characterized by X-ray diffraction analysis (XRD), scanning electron microscopy (SEM), transmission electron microscopy (TEM), UV analysis, and dielectric studies. The crystalline nature and particle size of the CdO nanoparticles were characterized by Powder X-ray diffract...

We analyze graphene and some of the carbon allotropes for which graphene sheets form the basis. The real-space and reciprocal crystalline structures are analyzed. Theoretical X-ray diffraction (XRD) patterns are obtained from this analysis and compared with experimental results. We show that staggered two-dimensional hexagonal lattices of graphite have XRD patterns that differ significantly fro...

Geochemical analysis of the surface material of terrestrial type planets is of fundamental importance in understanding the geological context of the planetary environment. Consequently this analysis should be performed whenever possible and indeed this has occurred on a number of previous landers. Current techniques include X-ray fluorescence (XRF) and Rutherford back-scattering of alpha partic...