Influence of machining parameters, viz., spindle speed, depth of cut and feed rate, on the quality of surface produced in CNC end milling is investigated. In the present study, experiments are conducted for three different workpiece materials to see the effect of workpiece material variation in this respect. Five roughness parameters, viz., centre line average roughness, root mean square roughn...

In this paper, Al-doped ZnO thin film transistors (AZO-TFT) were fabricated by the thermal evaporation growth of AZO channel layer on a silicon substrate at temperatures below 250°C. A SiO2 dielectric layer grown by the horizontal furnace was used as a gate. An active layer thickness of 10nm was measured by Atomic Force Microscopy (AFM), and its surface had root mean square (rms) roughness 12.6...

The scaling properties of a post-mortem mortar crack surface are investigated. The root mean square of the height fluctuations is found to obey anomalous scaling properties, but with three exponents, two of them characterizing the local roughness ( zeta approximately 0.79 and zetae approximately 0.41 ) and the third one driving the global roughness (zetag approximately 1.60) . The critical expo...

A set of modified roughness parameters (N%‐Rpv's) is introduced based upon the separate distribution of peaks and valleys. These new measures of surface roughness are utilized to quantitatively evaluate the as‐rolled and deformation‐induced surface roughness of Al sheets. N%‐Rpv is defined as the difference between the average heights of the upper N% of peaks and the lower N% of valleys. As N d...

We present a novel approach for computing the surface roughness-limited thermal conductivity of silicon nanowires with diameter D<100 nm. A frequency-dependent phonon scattering rate is computed from perturbation theory and related to a description of the surface through the root-mean-square roughness height Delta and autocovariance length L. Using a full phonon dispersion relation, we find a q...

We model and compare the thermal conductivity of rough semiconductor nanowires (NWs) of Si, Ge, and GaAs for thermoelectric devices. On the basis of full phonon dispersion relations, the effect of NW surface roughness on thermal conductivity is derived from perturbation theory and appears as an efficient way to scatter phonons in Si, Ge, and GaAs NWs with diameter D < 200 nm. For small diameter...

In this study, we investigated the feasibility of using the C-band European Remote Sensing Satellite (ERS-1) synthetic aperture radar (SAR) data to estimate surface soil roughness in a semiarid rangeland. Radar backscattering coefficients were extracted from a dry and a wet season SAR image and were compared with 47 in situ soil roughness measurements obtained in the rocky soils of the Walnut G...

Chemical vapour deposition (CVD) grown boron-doped nanocrystalline diamond (B-NCD) is an attractive material for the fabrication of high frequency superconducting nanoelectromechanical systems (NEMS) due to its high Young's modulus. The as-grown films have a surface roughness that increases with film thickness due to the columnar growth mechanism. To reduce intrinsic losses in B-NCD NEMS it is ...

The polymer materials are widely used in replication technologies. Recently different methods such as polymer imprinting, casting, hot embossing, injection molding were successfully used for polymer replication of the different surface structures with nanometer scale elements [1-4]. However, most investigations are connected only with resolution studies and directed at fabrication of sub-micron...

Al2O3 films were prepared using electron beam evaporation at room temperature. The samples were irradiated with oxygen plasma under different energy. The variations in average surface defect density and root mean square (RMS) surface roughness were characterized using an optical microscope and an atomic force microscope. Surface average defect density increased after plasma treatment. The RMS s...