In this research work we have coated WC (tungsten carbide) tool inserts with diamond like carbon coatings. The deposition was done using the thermal Chemical Vapour Deposition (CVD) method. We used bagasse of sugarcane which is an agriculture waste as a precursor for developing Surface finish, cutting temperature and forces as-developed coatings on were examined analyzed in work. For confirming...

This chapter focuses on the recent development and optimization of analytical electron microscopy to understand the dynamic changes in the bulk and interfaces of electrodes and electrolytes within all solidstate batteries. Three major aspects are covered: (1) design and fabrication of all solid-state batteries that remain functional after careful focused ion beam (FIB) processing; (2) enablemen...

In this paper a self-developed polycrystalline diamond coating was done on tungsten carbide (WC) tool insets by using simple thermal chemical vapor deposition technique. The growth of these films has been carried out at ~900 ºC temperature. as-grown the surface inserts have characterized Raman spectrometer and scanning electron microscope (SEM). morphological studies reveal that are high crysta...

Orpiment, getchellite and stibnite from Zarshuran deposit, NW Iran, exhibit extensive As-Sb substitution. There are four known minerals along As2S3-Sb2S3 join, i.e. orpiment (As2S3), Wakabayashilite [(As,Sb)20S30], getchellite (AsSbS3) and stibnite (Sb2S3). Extensive mineralogical studies by scanning electron microscope (SEM) and electron probe micro-analyzer (EPMA) indicate that getchellite fr...

Graphene sheets have been exfoliated from bulk graphite using high energy wet milling in two different solvents that were 2-ethylhexanol and kerosene. The milling process was performed for 60 h using a planetary ball mill. Morphological characteristics were investigated using scanning electron microscope (SEM) and transmission electron microscope (TEM). On the other hand, the structural charact...

In integrated circuit industry, device metrology is crucial to the future development of semiconductor industry. Critical dimension scanning electron microscope (CD-SEM) is used as a tool for the linewidth measurement and critical dimension (CD) metrology. However, the signal intensity in a secondary electron image obtained by CD-SEM is influenced not only by geometry character of specimen but ...

Progress in the processing of wet tissues, without the need of fixation and complex preparation procedures, may facilitate the microscopic examination of tissues and cells. Microscopic examination of tissues is a central tool in clinical diagnosis as well as in diverse areas of research. The authors present the application of Wet SEM, a technology for imaging fully hydrated samples at atmospher...

Background: Electrical Discharge Machining (EDM) is a well-established non-conventional machining process for the machining of electrically conductive and difficult-to-machine materials. But its applications are limited because of the slow machining rate and poor surface finish. Powder mixed EDM (PMEDM) is unitary of the recent progresses in the EDM process in which powder particles mixed in th...

The causes of liquation cracking in the heat-affected zone (HAZ) of a cast Mar-M004 superalloy weld were investigated. X-ray diffraction (XRD), electron probe microanalyzer (EPMA), and electron backscatter diffraction (EBSD) were applied to identify the final microconstituents at the solidification boundaries of the cast alloy. Fine borides and lamellar eutectics were present in front of some γ...