The modulated reflected and nonreflected light fluxes, measured as the azimuth of incident linearly polarized light is varied, yield the absolute reflectances R(p), and R(s), of a dielectric or semiconductor surface. Application to a reflective Si detector determines the refractive index and thickness of a SiO(2) film on the detector surface.

DRS Sensors & Targeting Systems, supported by detector materials supplier Lawrence Semiconductor Research Laboratory, is developing far-infrared detectors jointly with NASA Langley under the Far-IR Detector Technology Advancement Partnership (FIDTAP). The detectors are intended for spectral characterization of the Earth’s energy budget from space. During the first year of this effort we have de...

Abstract Space radiation particles will cause a variety of effects on orbiting satellites, such as single event effects, total ionizing dose, displacement damage, etc. In response to these space BeiDou Navigation satellites M15/M16 operating in medium earth orbit (MEO) developed the first integrated monitor for high-energy proton and particle based detection technology. This payload realizes jo...

BACKGROUND Patients with somatostatin receptor-expressing neuroendocrine tumours can be treated with intravenously administered 177Lu-octreotate. Few patients are cured with the present protocol due to the current dose limitation of normal organs at risk, such as the kidneys. By locally administering 177Lu-octreotate to the liver for the purpose of treating liver metastases, a substantially red...