نتایج جستجو برای: scanning hall probe microscopy

تعداد نتایج: 439664  

Journal: :The Review of scientific instruments 2014
Özgür Karcı Julian O Piatek Pau Jorba Münir Dede Henrik M Rønnow Ahmet Oral

We describe the design of a low temperature scanning Hall probe microscope (SHPM) for a dilution refrigerator system. A detachable SHPM head with 25.4 mm OD and 200 mm length is integrated at the end of the mixing chamber base plate of the dilution refrigerator insert (Oxford Instruments, Kelvinox MX-400) by means of a dedicated docking station. It is also possible to use this detachable SHPM h...

1992
Gopal Sarma Pingali Ramesh Jain

This paper presents an al~or i f l i rn for recovering, in st lu, thc shapc of zhc probp used in FL Rcnnnlng prohe microscope. Thp inputs to the d g o r ~ l ~ l ~ n i are the imREP of A reference si~rlarc and the known shapc of 1 he rrCerence surIacr Thr o11tpi11 in n drpth map rrprewriting the lhrw ~ l i r n ~ n ~ i o n a l sh pr of ~11c prnhr 'I'his recovered pmbc shapc can ho uscd to rPstorP...

2009
R. Akram Ghulam Ishaq Khan M. Dede

The authors present a comparative study on imaging capabilities of three different micro-Hall probe sensors fabricated from narrow and wide band gap semiconductors for scanning hall probe microscopy at variable temperatures. A novel method of quartz tuning fork atomic force microscopy feedback has been used which provides extremely simple operation in atmospheric pressures, high-vacuum, and var...

H. Savaloni K. Khojier,

This paper reports the correlation between film thickness, nanostructure and DC electrical properties of copper thin films deposited by PVD method on glass substrate. X-ray diffraction (XRD) and atomic force microscopy (AFM) were used for crystallography and morphology investigation, respectively. Resistivity was measured by four point probe instrument, while a Hall effects measurement system w...

Journal: :Beilstein Journal of Nanotechnology 2010

Journal: :Archives of Histology and Cytology 2002

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