This paper reports on a study of the scanning electron microscope (SEM) Moiré method. Tests were carried out by rotating the specimen grating slightly with respect to the electron scanning raster lines, to verify that the Moiré images captured were really due to the interference between specimen and reference gratings. The experimental results coincided well with the calculated theoretical valu...

The scanning electron microscope (SEM) provides an ideal system for studying the three-dimensional surface structure of biological materials . Our previous work on the protozoan Opalina showed that instantaneous fixation, combined with critical point drying, faithfully preserved the pattern of ciliary coordination and the form of ciliary beat for scanning electron microscopy (1, 2) . I report h...

Scanning electron microscopy (SEM) and transmission electron microscopy (TEM) are widely used in material science, metallurgy sicence and life science researches. TEM is an imaging technique where a beam of electrons is focused onto a specimen causing an enlarged version to appear on a fluorescent screen or layer of photographic film. SEM is a technique of electron microscope to produce high re...

National Institute of Standards and Technology, Gaithersburg, MD 20899-0001 During the manufacturing of presentday integrated circuits, certain measurements must be made of the submicrometer structures composing the device with a high degree of repeatability. Optical microscopy, scanning electron microscopy, and the various forms of scanning probe microscopies are major microscopical techniques...

An atomic force microscope (AFM) and spectrometer combined system for in-situ thickness measurement of nano-porous alumina (PA) films is introduced. The AFM is applied to obtain the porosity of PA film, and then we calculate the effective refractive index by Maxwell-Garnett effective dielectric constant theory. The optical thickness of PA film is determined by reflective interference spectromet...

A technique has been developed to examine the same G-banded human metaphase chromosomes, first in the light microscope and then in the scanning electron microscope (SEM). A structural involvement in chromosome banding was confirmed by a positional correlation between the G-positive bands observed in the light microscope and the circumferential grooves between the quaternary coils of the metapha...

Progress in the processing of wet tissues, without the need of fixation and complex preparation procedures, may facilitate the microscopic examination of tissues and cells. Microscopic examination of tissues is a central tool in clinical diagnosis as well as in diverse areas of research. The authors present the application of Wet SEM, a technology for imaging fully hydrated samples at atmospher...

Scanning electron microscope (SEM) and scanning ion microscope (SIM) observations were performed to investigate the charging effect and the related contrast variation for images of conductive and non-conductive specimens under electron and Gaþ ion beam irradiations. The contrast variation in the specimens was investigated by changing the coating conditions. It was found that the contrast in con...

A new experimental method is introduced in order to characterize the mechanical properties of metallic nanowires. An accurate mechanical characterization of nanowires requires simultaneous imaging using scanning electron microscope (SEM) and mechanical testing with an atomic force microscope (AFM). In this study, an AFM is located inside an SEM chamber in order to establish the visibility of th...

The Transition Edge Sensor (TES)-Energy Dispersive Spectrometer (EDS) is an X-ray detector with high-energy resolution (12.8 eV). The TES can be mounted to a scanning electron microscope (SEM). The TES-EDS is based on a cryogen-free dilution refrigerator. The high-energy resolution enables analysis of the distribution of various elements in samples under low acceleration voltage (typically unde...